2011
DOI: 10.1063/1.3625343
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The X-ray Fluorescence Microscopy Beamline at the Australian Synchrotron

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Cited by 233 publications
(156 citation statements)
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“…Details of the x-ray fluorescence microscopy (XFM) beamline at the Australian Synchrotron have been described by Paterson et al (2011). Kopittke et al (2011) have provided information on operating conditions for the study of fresh plant material.…”
Section: Plant Growth Elemental Mapping and Laterally Resolved Specmentioning
confidence: 99%
“…Details of the x-ray fluorescence microscopy (XFM) beamline at the Australian Synchrotron have been described by Paterson et al (2011). Kopittke et al (2011) have provided information on operating conditions for the study of fresh plant material.…”
Section: Plant Growth Elemental Mapping and Laterally Resolved Specmentioning
confidence: 99%
“…Elemental mapping of larger cell areas was carried out at the XFM beamline [42] at the AS using a monochromatic 12.055 keV X-ray beam focused to 2 μm in the horizontal and vertical dimensions using a Kirk-Patrick Baez mirror and a silicon drift diode detector operating in fluorescence mode. Elemental maps were acquired over 120 × 120 µm 2 areas using a 2 µm step size and 1 s/point dwell time.…”
Section: Microprobe Synchrotron Radiation X-ray Fluorescence (Sr-xrf)mentioning
confidence: 99%
“…In this way sample damage can be minimized. This has entailed design of Maia coordinated with the design of the XFM end-stations [2] at the Australian Synchrotron (AS). Its KB mirror end-station, with its large working distance of 69 mm provided little challenge.…”
Section: Introductionmentioning
confidence: 99%