IEEE Trans. Electron Devices
 1978
DOI: 10.1109/t-ed.1978.19194
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The use of a silicon-gate C-MOS/SOS test vehicle to evaluate technology maturity

R.T. Jerdonek
1
,
H.F. Bare2,
G.J. Fromen3
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Design of a comprehensive process evaluation vehicle for development of small geometry CMOS process

Bandyopadhyay1,
Govindacharyulu2,
Zarabi3
1984
Microelectronics Reliability
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Design of a comprehensive process evaluation vehicle for development of small geometry CMOS process

Bandyopadhyay1,
Govindacharyulu2,
Zarabi3
1984
Microelectronics Reliability
0
0
0
0
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Microelectronic Test Chips for VLSI Electronics

Buehler
1
1983
Materials and Process Characterization
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Assessment of Digital Twin Virtual-Real Connected Interaction Based on NLP

Han,
Song,
Wang
et al. 2023
2023 2nd International Conference on Artificial Intelligence and Intelligent Information Processing (AIIIP)
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