The Trapped Proton Environment in Medium Earth Orbit (MEO)

Ginet, G. P.; Huston, S. L.; Roth, C.; O’Brien, T. P.; Guild, T. B.

doi:10.1109/tns.2010.2085086

Cited by 8 publications

(6 citation statements)

References 17 publications

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“…Ginet et al . [] (corrected by Ginet et al . []) provide composite models of the trapped proton environment.…”

Section: Discussionmentioning

confidence: 99%

“…[] (corrected by Ginet et al . []) provide composite models of the trapped proton environment. Their model 1 is probably more applicable to our observations and predicts upset rates between 0.5 and 1.8 times the AP8 model.…”

Section: Discussionmentioning

confidence: 99%

“…It has already been noted that the CREME96 model could not support the evolution of the Double Star orbit. Ginet et al [2010] (corrected by Ginet et al [2012]) provide composite models of the trapped proton environment. Their model 1 is probably more applicable to our observations and predicts upset rates between 0.5 and 1.8 times the AP8 model.…”

Section: Discussionmentioning

confidence: 99%

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Single‐event upsets in the Cluster and Double Star Digital Wave Processor instruments

2014

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Radiation-induced upsets are an important issue for electronic circuits operating in space.Upsets due to solar protons, trapped protons, and galactic cosmic rays are frequently observed. Modeling the expected frequency of upsets is a necessary part of the design process for space hardware. The Cluster and Double Star spacecraft were respectively European and Chinese missions dedicated to the study of the wave and particle environment in the Earth's magnetosphere. All four Cluster spacecraft and one Double Star spacecraft included a Digital Wave Processor (DWP) instrument. The primary purpose of this instrument was as the central controller of the Wave Experiment Consortium. This paper investigates the occurrence of radiation-induced single-event upsets in these DWP instruments. The memory devices used in the DWP were not specifically radiation-hardened parts and so are relatively sensitive to single-event effects. We present the experience gained during the first 11 years of operation of the Cluster mission and the nearly 4 year lifetime of the Double Star TC-1 spacecraft and compare with models of the radiation environment.

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“…Ginet et al . [] (corrected by Ginet et al . []) provide composite models of the trapped proton environment.…”

Section: Discussionmentioning

confidence: 99%

Section: Discussionmentioning

confidence: 99%

Section: Discussionmentioning

confidence: 99%

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Single‐event upsets in the Cluster and Double Star Digital Wave Processor instruments

2014

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“…More reliable fluxes can be obtained, at additional computational cost, through spectral inversion methods that can use all the channels together to estimate the shape of the proton and electron spectra [see, e.g., Ginet et al, 2010].…”

Section: 1002/2015sw001166mentioning

confidence: 99%

Using Polar‐orbiting Environmental Satellite data to specify the radiation environment up to 1200 km altitude

et al. 2015

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Data from the Deal dosimeter payload on the Rapid Pathfinder satellite provide daily maps of the radiation environment on a sphere at 1200 km altitude. Through the use of magnetic coordinates, these dosimeter maps can be projected down to lower altitudes, providing valuable information for satellite anomaly resolution for vehicles in low Earth orbit (LEO). Unfortunately, the Deal data are not widely available, and the mission has a limited lifetime. As an alternative, we present a method to estimate the Deal daily maps using belt index data from NOAA's Polar-orbiting Environmental Satellite (POES) vehicles. The method addresses only trapped radiation but could readily be supplemented with POES's own measurements of solar particle radiation reaching LEO.

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“…In the space radiation environment, charges generated on particle tracks are collected by sensitive nodes, resulting in instantaneous changes in voltage and current, called single event transients (SETs) [1], [2]. SETs can cause abnormal operation of phase-locked loops, operational amplifiers and IO analog linear circuits.…”

Section: Introductionmentioning

confidence: 99%

Synergistic Effect of BTI and Process Variations on the Soft Error Rate Estimation in Digital Circuits

Xiao

Liu

et al. 2022

IEEE Access

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Soft errors, aging effects and process variations have become the three most critical reliability issues for nanoscale complementary metal oxide semiconductor (CMOS) circuits. In this paper, the effects of bias temperature instability (BTI) and process variations on the threshold voltage of MOS devices are theoretically deduced, and the drift of the threshold voltage under the synergistic effect of BTI and process variations is analyzed. Based on the deduced threshold voltage drift formula under the synergistic effect, the critical charge and delay of different logic gates under different aging times in NanGate's 45 nm process are simulated and analyzed. A method based on the change in the critical charge and delay of the soft error rate (SER) calculation considering BTI effect and process variations is given, and the effectiveness of our method comprehensively demonstrated using the ISCAS85,89 benchmarks. As a result, we can observe that the effect of only considering the BTI effect on the critical charge of the circuit is smaller than that of considering both the BTI effect and process variations. The simulation results show that with increasing aging time, the synergistic effect of BTI and process variations makes the increase in the soft error rate more serious than the impact of either effect alone.

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The Trapped Proton Environment in Medium Earth Orbit (MEO)

Cited by 8 publications

References 17 publications

Single‐event upsets in the Cluster and Double Star Digital Wave Processor instruments

Single‐event upsets in the Cluster and Double Star Digital Wave Processor instruments

Using Polar‐orbiting Environmental Satellite data to specify the radiation environment up to 1200 km altitude

Synergistic Effect of BTI and Process Variations on the Soft Error Rate Estimation in Digital Circuits

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