2014
DOI: 10.1002/2013sw000985
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Single‐event upsets in the Cluster and Double Star Digital Wave Processor instruments

Abstract: Radiation-induced upsets are an important issue for electronic circuits operating in space.Upsets due to solar protons, trapped protons, and galactic cosmic rays are frequently observed. Modeling the expected frequency of upsets is a necessary part of the design process for space hardware. The Cluster and Double Star spacecraft were respectively European and Chinese missions dedicated to the study of the wave and particle environment in the Earth's magnetosphere. All four Cluster spacecraft and one Double Star… Show more

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Cited by 8 publications
(2 citation statements)
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“…(123,124) Energetic electrons trapped in the outer radiation belt cause electrostatic charging and discharging, which can damage sensitive electronic equipment and solar panels. (125)(126)(127)(128)(129) SEPs can cause displacement damage (reducing device performance) and single event effects (SEEs), (130)(131)(132) which are a growing issue as devices are miniaturized. (17) During the 2003 Halloween storms, 47 satellites reported anomalies (out of 450 in orbit, i.e., ß10%), one scientific satellite was lost, and 10 satellites lost operational service for more than one day.…”
Section: Satellite Infrastructurementioning
confidence: 99%
“…(123,124) Energetic electrons trapped in the outer radiation belt cause electrostatic charging and discharging, which can damage sensitive electronic equipment and solar panels. (125)(126)(127)(128)(129) SEPs can cause displacement damage (reducing device performance) and single event effects (SEEs), (130)(131)(132) which are a growing issue as devices are miniaturized. (17) During the 2003 Halloween storms, 47 satellites reported anomalies (out of 450 in orbit, i.e., ß10%), one scientific satellite was lost, and 10 satellites lost operational service for more than one day.…”
Section: Satellite Infrastructurementioning
confidence: 99%
“…These energetic particles can induce SEUs either by direct ionization or by indirect ionization [2]. Since the particle flux directly determines the SEU rate of an electronic system, based on the data obtained from past space missions [3] [4], the SEU rate may increase hundreds to thousands of times during the SPE peak periods. Thus, it is important to track the variation in particle flux in real-time, and consequently activate the suitable mitigation techniques to protect the sensitive elements in the on-board electronic systems.…”
Section: Introductionmentioning
confidence: 99%