1985
DOI: 10.1016/0039-6028(85)90694-6
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The surface geometry of GaAs(110)

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Cited by 44 publications
(6 citation statements)
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“…This computational recipe has provided well converged geometries for the fully relaxed clean GaAs͑110͒ surface and the ECLS, which are in good agreement with the experimental results [19][20][21][22] and other previous calculations 2,5,23,24 and for their band structures.…”
Section: Computational Detailssupporting
confidence: 87%
“…This computational recipe has provided well converged geometries for the fully relaxed clean GaAs͑110͒ surface and the ECLS, which are in good agreement with the experimental results [19][20][21][22] and other previous calculations 2,5,23,24 and for their band structures.…”
Section: Computational Detailssupporting
confidence: 87%
“…Among the surfaces of binary semiconductors, GaAs(110) has been studied the most, both experimentally [9][10][11][12][13][14][15] and theoretically [16][17][18][19][20][21][22][23][24]. It is now well established that the surface relaxation is mainly characterized by a bond-length-conserving rotation of the surface chains by a tilt angle of about 30° [9][10][11][16][17][18][19], with As shifted above the ideal (110) plane and Ga shifted towards the bulk.…”
mentioning
confidence: 99%
“…It is now well established that the surface relaxation is mainly characterized by a bond-length-conserving rotation of the surface chains by a tilt angle of about 30° [9][10][11][16][17][18][19], with As shifted above the ideal (110) plane and Ga shifted towards the bulk. In contrast to the detailed examinations of the structural and electronical properties, up to now only a few investigations have been made on the surface phonons of GaAs(llO).…”
mentioning
confidence: 99%
“…The relative displacement of the cation and the anion within the outermost layer defines a rotation angle ~o (see figure 14) which is generally believed to play a unique role in characterizing this reconstruction pattern. It is this parameter which has been the subject of many recent experimental investigations using ELEED (Tong et al 1984, Duke and Paton 1985, Puga et al 1985, high-energy ion channelling (Grossmann and Gibson 1984), and medium-energy ion-scattering (Smit et al 1985) measurements. However, there is usually quite a spread for the tilt angle predicted by different experimental techniques.…”
Section: (V) the (110) Surface Of Iii-v And Ii-vi Semiconductorsmentioning
confidence: 98%