“…Neuville [30] has reviewed that the conclusions on the material structure (various characterization results) should always be in agreement to each other and especially coherent with the hardness measurement. The hardness itself depends on chemical bonds [2,14,17,21,26,29] and atomic density within the films, especially when other types of atoms (contaminants, dopants such as O, N, B and metals) are incorporated in the carbon based films [31]. This interpretation can also support the phenomena that the hardness of CN x films increases in the case of cross-linking of graphitic planes by sp 3 bonded carbons, which is widely accepted in the literature [2,32].…”