The spectral response of silicon X-ray detectors

Chemical character of BCxNy layers grown by CVD with trimethylamine borane

“…The [16] or a novel silicon drift detector (SDD). [17] The distance between the sample and the detector could be varied from a few mm up to several cm. At each point of the energy scan the detected count rate was recorded during a preselected lifetime of, e.g.…”

An empirical derivation of the X-ray optic transmission profile used in calibrating the Planetary Instrument for X-ray Lithochemistry (PIXL) for Mars 2020

“…However, the measured spectrum is non-zero in this region, owing primarily to probabilistic electron escape and incomplete charge collection processes that occur in the Si detector wafer. The physics of these phenomena are well documented (Lowe, 2000;Campbell et al, 2001;Papp, 2003;Eggert et al, 2006;Scholze and Procop, 2009) but are not reproduced by our modeling code. Thus, since the measured/calculated division is a positive number divided over zero, the calculation diverges.…”

The instrumental blank of the Mars Science Laboratory alpha particle X-ray spectrometer

“…2 shows that the nickel counting rate from a nickel sample falls with distance as expected, according approximately to the inverse square law. A small silicon peak, which may arise from a layer of incomplete charge collection at the detector surface [8] emulates this behavior. But the zirconium K peak intensity falls much less steeply and levels out.…”