1997
DOI: 10.1016/s0921-4526(97)00528-0
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The SINQ instrument control software system

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Cited by 15 publications
(12 citation statements)
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“…All motorized stages are controlled by the ANSTO implementation of the SINQ Instrument Control Software (SICS) [10]. SICS allows batch scripting of instrument parameters thereby allowing experimental sequences to be pre-programmed.…”
Section: Instrument Controlmentioning
confidence: 99%
“…All motorized stages are controlled by the ANSTO implementation of the SINQ Instrument Control Software (SICS) [10]. SICS allows batch scripting of instrument parameters thereby allowing experimental sequences to be pre-programmed.…”
Section: Instrument Controlmentioning
confidence: 99%
“…The PITSI detector assembly employs 15 vertically stacked Reuter-Stokes model RS-P4-0824-208 linear position sensitive 3 He-filled tubes to cover an effective active area of ∼ 610 × 375 mm 2 and subtends a 2θ angle of ∼ 20 • at a sample-to-detector distance of 1.6 m. The detector tube properties are given in Table 1. The linear resolution of the bank is 2 mm (H) × 25 mm (V) which corresponds to diffraction resolution of d/d =∼ 3 × 10 −3 .…”
Section: Detector Bankmentioning
confidence: 99%
“…The PEMs operating parameters are configured via the IA software PSDControl which calibrates each detector using data of isotropically scattered neutrons transmitted through a cadmium mask with regular vertical slits that is positioned in front of the detector array. Calibrated data is requested from the Ansto Histogram Memory Server (HM) via a TCP/IP protocol which provides it to the SINQ Instrument Control Software (SICS) [3]. The spatially scattered data is stored together with a complete list of instrument parameters in a NeXus data file.…”
Section: Data Acquisition and Reductionmentioning
confidence: 99%
“…The pin location can be measured either using a digital dial gauge [3] or a telecentric camera alignment system [4]. Communication modules for both the digital dial gauge and the camera system were created in the MPISI control system SICS [5] in order to automate alignment procedures. After the axes of the measurement device are aligned with the axes of the sample positioning table, the x and y-axes offsets needed to move the alignment pin to the CoR must be determined.…”
Section: Center Of Rotationmentioning
confidence: 99%