2013
DOI: 10.1063/1.4818119
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The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy

Abstract: The resistive switching characteristics of TiO2 thin films were investigated using conductive atomic force microscopy (CAFM) and Kelvin probe force microscopy (KPFM). The as-prepared TiO2 thin films were modulated into higher and lower resistance states by applying a local electric field. We showed that the resistive switching results from charge injection and release assisted by electro-migration of oxygen ions. An integrated model combined with filamentary and interfacial effects was utilized to elucidate th… Show more

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Cited by 40 publications
(28 citation statements)
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“…As indicated in the O 1s XPS spectrum, after OER reaction, there is a significant increase in the relative intensity of vacancy O 2− and O–C peaks (Figure f). The latter confirms the oxidation of carbon layer during OER, whereas the increased intensity of O 2− vacancies might have resulted from the positive voltage‐induced O 2− migration by extracting O 2− from the lattice . Therefore, we conclude that, despite the slight oxidation of the TiO x N y surface and carbon layer in the composite, its conductive and OV‐rich TiO 2− x (or Ti 2 O 3 ) outer surface was preserved during OER.…”
supporting
confidence: 59%
“…As indicated in the O 1s XPS spectrum, after OER reaction, there is a significant increase in the relative intensity of vacancy O 2− and O–C peaks (Figure f). The latter confirms the oxidation of carbon layer during OER, whereas the increased intensity of O 2− vacancies might have resulted from the positive voltage‐induced O 2− migration by extracting O 2− from the lattice . Therefore, we conclude that, despite the slight oxidation of the TiO x N y surface and carbon layer in the composite, its conductive and OV‐rich TiO 2− x (or Ti 2 O 3 ) outer surface was preserved during OER.…”
supporting
confidence: 59%
“…8 Furthermore, such interface-modulated resistive switching has been extensively reported for other transition-metal oxides. [15][16][17][18][19][20][21][22] In these breakthroughs, electronic structures and physical properties of STO-based interfaces are important in the functionalization of oxide electronics. Hence, a deep understanding of charge transfer and interfacial band alignment is the key to further improve the performance of functional devices based on STO and other oxides.…”
Section: Introductionmentioning
confidence: 99%
“…61 Releasing oxygen gas which originated from oxygen ion oxidized at the anode results in oxygen vacancies in the ZnO film. According to the Kröger-Vink notation, this process can be expressed as…”
Section: Resultsmentioning
confidence: 99%