The reliability investigation of PV junction box based on 1GW worldwide field database

Chang, Ming-Kuen; Chen, ChienYu; Hsueh, Chun‐Hway; Hsieh, Wei-Jung; Yen, E.; Ho, K.L.; Chuang, Hung-Yang; Lee, C. Y.; Chen, Haomin

doi:10.1109/pvsc.2015.7356130

Cited by 6 publications

(2 citation statements)

References 1 publication

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“…Burned cables and defective boxes are much more common than one might expect. 38 All the modules present detachment of the screw terminal block inside the connection box (classified as T3 and also reported in the literature 39 ). All the PV modules have a slight level of frame corrosion (defect T4, Figure 2D).…”

Section: Visual Inspectionmentioning

confidence: 83%

Analysis of the degradation of single‐crystalline silicon modules after 21 years of operation

Piliougine

Oukaja

Sánchez-Friera

et al. 2021

Progress in Photovoltaics

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In this paper, the results of the analysis of the degradation of a set of single-crystalline silicon modules after 21 years are presented. The comparison of the main electrical parameters and the series and of the shunt resistances measured in 1996 and 2017 is performed, so that the annual degradation rate is evaluated. In addition, a detailed analysis of the parameter uncertainties has been performed in order to determine its impact on the results. A visual inspection of the modules has also been carried out in order to show the correlation with the variation of the electrical performance.Finally, the temperature coefficients of the degraded modules have been estimated and compared with the nominal ones. The results shown in the paper reveal that the mean annual degradation rate in terms of power is close to 0.9%. KEYWORDSI-V curve correction, outdoor measurement, photovoltaic degradation, temperature coefficient, uncertainty analysis, visual defect main electrical parameters and the increase in their dispersion have to be considered. As each module tends to degrade in a different way, the behavior of the modules will be more and more different as time goes by, thus affecting negatively the global performance of the plant.According to Köntges et al. 2 a module defect is an irreversible damage that causes either a degradation in terms of power or a security risk. These defects can be classified in different categories wileyonlinelibrary.com/journal/pip

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Section: Visual Inspectionmentioning

confidence: 83%

Analysis of the degradation of single‐crystalline silicon modules after 21 years of operation

Piliougine

Oukaja

Sánchez-Friera

et al. 2021

Progress in Photovoltaics

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“…The reliability of the junction box is one of the most important issues in the proper operation of PV. On average, 85% of junction box failures have their source in the system installation and most often occur within the first three months of the photovoltaic system's installation [18,19]. The main causes include excessive stress in the system, poor attachment of the junction box to the rear wall, poorly closed cover, moisture, and incorrect wiring [20].…”

Section: Introductionmentioning

confidence: 99%

Influence of Environmental Conditions on the Electrical Parameters of Side Connectors in Glass–Glass Photovoltaic Modules

Barbusiński,

Kwaśnicki,

Gronba-Chyła

et al. 2024

Energies

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This work focused on the verification of the electrical parameters and the durability of side connectors installed in glass–glass photovoltaic modules. Ensuring the safe use of photovoltaic modules is achieved, among others, by using electrical connectors connecting the PV cell circuit inside the laminate with an external electric cable. In most of the cases for standard PV modules, the electrical connector in the form of a junction box is attached from the back side of the PV module. The junction box is glued to the module surface with silicone where the busbars were previously brought out of the laminate through specially prepared holes. An alternative method is to place connectors on the edge of the module, laminating part of it. In such a case, the specially prepared “wings” of the connector are tightly and permanently connected using laminating foil, between two glass panes protecting against an electrical breakdown. Additionally, this approach eliminates the process of preparing holes on the back side of the module, which is especially complicated and time-consuming in the case of glass–glass modules. Moreover, side connectors are desirable in BIPV applications because they allow for a more flexible design of installations on façades and walls of buildings. A series of samples were prepared in the form of PV G-G modules with side connectors, which were then subjected to testing the connectors for the influence of environmental conditions. All samples were characterized before and after the effect of environmental conditions according to PN-EN-61215-2 standards. Insulation resistance tests were performed in dry and wet conditions, ensuring full contact of the tested sample with water. For all modules, before being placed in the climatic chamber, the resistance values were far above the minimum value required by the standards, allowing the module to be safely used. For the dry tests, the resistance values were in the range of GΩ, while for the wet tests, the obtained values were in the range of MΩ. In further work, the modules were subjected to environmental influences in accordance with MQT-11, MQT-12, and MQT-13 and then subjected to electrical measurements again. A simulation of the impact of changing climatic conditions on the module test showed that the insulation resistance value is reduced by an order of magnitude for both the dry and wet tests. Additionally, one can observe visual changes where the lamination foil is in contact with the connector. The measurements carried out in this work show the potential of side connectors and their advantage over rear junction boxes, but also the technological challenges that need to be overcome.

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Analytical modeling of reversible performance loss of PV modules and module arrays

Abenante

2022

Solar Energy

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The reliability investigation of PV junction box based on 1GW worldwide field database

Cited by 6 publications

References 1 publication

Analysis of the degradation of single‐crystalline silicon modules after 21 years of operation

Analysis of the degradation of single‐crystalline silicon modules after 21 years of operation

Influence of Environmental Conditions on the Electrical Parameters of Side Connectors in Glass–Glass Photovoltaic Modules

Analytical modeling of reversible performance loss of PV modules and module arrays

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