The quantitative study of X-ray diffraction dynamics near atomic absorption edge

Zhou, Shengming; Zhao, Zhibing; Fukamachi, T.; Negishi, R.; Yoshizawa, Masami; Nakajima, Tetsuo

doi:10.1016/s0921-4526(96)00472-3

Physica B: Condensed Matter

1996

DOI: 10.1016/s0921-4526(96)00472-3

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The quantitative study of X-ray diffraction dynamics near atomic absorption edge

Shengming Zhou

Zhibing Zhao

T. Fukamachi

et al.

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2020

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“…Previously, this phenomenon was observed when studying x-ray diffraction on GaAs crystals. 19 The present study with the energy step of 1 eV allowed us to observe the oscillations of the diffracted x-ray intensity after the K absorption edge of Ga [Fig. 4(d)].…”

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confidence: 93%

X-ray diffraction on La3Ga5SiO14 crystal modulated by SAW near the K absorption edge of Ga

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Ortéga

Vadilonga

et al. 2020

Applied Physics Letters

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The process of x-ray diffraction on the La 3 Ga 5 SiO 14 (LGS) crystal modulated by surface acoustic waves (SAWs) near the K absorption edge of Ga (E ¼ 10 367 eV) was studied. A redistribution of the diffracted x-ray intensity between the diffraction satellites occurs at the absorption edge due to the change in the x-ray penetration depth into the crystal and an effective change in the interaction of x-ray radiation with the near-surface crystal region modulated by SAW. The intensity distribution of the diffraction satellites starts to change smoothly immediately after the K absorption edge of Ga with a decrease in the x-ray penetration depth into the crystal.

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mentioning

confidence: 93%

X-ray diffraction on La3Ga5SiO14 crystal modulated by SAW near the K absorption edge of Ga

Рощупкин

Ortéga

Vadilonga

et al. 2020

Applied Physics Letters

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The quantitative study of X-ray diffraction dynamics near atomic absorption edge

Cited by 1 publication

References 12 publications

X-ray diffraction on La3Ga5SiO14 crystal modulated by SAW near the K absorption edge of Ga

X-ray diffraction on La3Ga5SiO14 crystal modulated by SAW near the K absorption edge of Ga

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