The present role of small particle accelerators for the study of Cultural Heritage

Mandò, P.A.; Fedi, Mariaelena; Grassi, N.

doi:10.1140/epjp/i2011-11041-9

Cited by 12 publications

(9 citation statements)

References 35 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The development of accelerators with extracted particle beam gives opportunity, in rare laboratories, to study art pieces by Particle Induced X-ray Emission (PIXE), Rutherford Backscattering Spectroscopy (RBS), etc. [134][135][136][137]. Synchrotron sources offer new tools (XRF and diffraction-microbeam, Infrared microspectrometry) that have been extensively used for a few years [138][139][140].…”

Section: The Analytical Techniques Of Artwork: Toward Non-destructivmentioning

confidence: 99%

The Destructive/Non-Destructive Identification of Enameled Pottery, Glass Artifacts and Associated Pigments—A Brief Overview

Colomban

2013

Arts

View full text Add to dashboard Cite

The birth of Chemistry can be found in two main practices: (i) the Arts du feu (ceramic and glass, metallurgy, i.e., inorganic and solid state chemistry) and (ii) the preparation of remedies, alcohols and perfumes, dyes, i.e., organic and liquid state chemistry). After a brief survey of the history of (glazed) pottery and (enameled) glass artifacts, the development of destructive and non-destructive analytical techniques during the last few centuries is reviewed. Emphasis is put on mobile non-destructive Raman microspectroscopy of pigments and their glass/glaze host matrices for chronological/technological expertise. The techniques of white opacification, blue, yellow, green, red, and black coloring, are used as examples to point out the interest of pigments as chronological/technological markers

show abstract

Section: The Analytical Techniques Of Artwork: Toward Non-destructivmentioning

confidence: 99%

The Destructive/Non-Destructive Identification of Enameled Pottery, Glass Artifacts and Associated Pigments—A Brief Overview

Colomban

2013

Arts

View full text Add to dashboard Cite

show abstract

“…XPS has exactly the same problem, and with the same solution. Angle-resolved XPS has received careful attention [167], and differential PIXE can vary either the beam energy or the angle of incidence: we mention recent work on multilayer targets [168] and a recent review of cultural heritage applications [169].…”

Section: Depth Profiling With Pixementioning

confidence: 99%

Ion Beam Analysis: A Century of Exploiting the Electronic and Nuclear Structure of the Atom for Materials Characterisation

Jeynes

Webb

Lohstroh

2011

Rev. Accl. Sci. Tech.

View full text Add to dashboard Cite

Analysis using MeV ion beams is a thin film characterisation technique invented some 50 years ago which has recently had the benefit of a number of important advances. This review will cover damage profiling in crystals including studies of defects in semiconductors, surface studies, and depth profiling with sputtering. But it will concentrate on thin film depth profiling using Rutherford backscattering, particle induced X-ray emission and related techniques in the deliberately synergistic way that has only recently become possible. In this review of these new developments, we will show how this integrated approach, which we might call “total IBA”, has given the technique great analytical power

show abstract

“…The particle-induced X-ray emission (PIXE) technique, using protons as source, is performed in facilities such as the Accélérateur Grand Louvre d'analyse élémentaire (AGLAE) (Menu et al, 1990;Radepont et al, 2018), located at the French Louvre laboratory -(C2RMF) (Zucchiatti and Redondo-Cubero, 2014), the AIFIRA facility at Centre d'Etudes Nucléaires Bordeaux-Gradignan (CENBG) (Barberet et al, 2009;Sorieul et al, 2014) and Instituto Nazionale di Fisica Nucleare-LAboratorio di tecniche nucleari per i BEni Culturali (INFN-LABEC) laboratory in Florence (Italy) (Giuntini et al, 2007;Ezeh et al, 2015;Re et al, 2015). In these laboratories, conventional electrostatic accelerators (such as Van der Graff tandems or Pellatron types) (Mandò et al, 2011) generate proton bunches with energies that range from 1 to 5 MeV, a beam current from few pA to nA (Chiari et al, 2002), a beam charge of the order of nC (Pichon et al, 2015). These proton beams irradiate the material samples (ceramics, paintings, bronze, etc.…”

Section: Introductionmentioning

confidence: 99%

Design and optimization of a laser-PIXE beamline for material science applications

et al. 2019

View full text Add to dashboard Cite

Multi-MeV proton beams can be generated by irradiating thin solid foils with ultra-intense (>1018 W/cm2) short laser pulses. Several of their characteristics, such as high bunch charge and short pulse duration, make them a complementary alternative to conventional radio frequency-based accelerators. A potential material science application is the chemical analysis of cultural heritage (CH) artifacts. The complete chemistry of the bulk material (ceramics, metals) can be retrieved through sophisticated nuclear techniques such as particle-induced X-ray emission (PIXE). Recently, the use of laser-generated proton beams was introduced as diagnostics in material science (laser-PIXE or laser-driven PIXE): Coupling laser-generated proton sources to conventional beam steering devices successfully enhances the capture and transport of the laser-accelerated beam. This leads to a reduction of the high divergence and broad energy spread at the source. The design of our hybrid beamline is composed of an energy selector, followed by permanent quadrupole magnets aiming for better control and manipulation of the final proton beam parameters. This allows tailoring both, mean proton energy and spot sizes, yet keeping the system compact. We performed a theoretical study optimizing a beamline for laser-PIXE applications. Our design enables monochromatizing the beam and shaping its final spot size. We obtain spot sizes ranging between a fraction of mm up to cm scale at a fraction of nC proton charge per shot. These results pave the way for a versatile and tunable laser-PIXE at a multi-Hz repetition rate using modern commercially available laser systems.

show abstract

The present role of small particle accelerators for the study of Cultural Heritage

Cited by 12 publications

References 35 publications

The Destructive/Non-Destructive Identification of Enameled Pottery, Glass Artifacts and Associated Pigments—A Brief Overview

The Destructive/Non-Destructive Identification of Enameled Pottery, Glass Artifacts and Associated Pigments—A Brief Overview

Ion Beam Analysis: A Century of Exploiting the Electronic and Nuclear Structure of the Atom for Materials Characterisation

Design and optimization of a laser-PIXE beamline for material science applications

Contact Info

Product

Resources

About