The present and future of high-resolution electron microscopy

Cowley, J. M.; Smith, David J.

doi:10.1107/s010876738709857x

Cited by 25 publications

(6 citation statements)

References 43 publications

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“…With electron microscopy becoming increasingly quantitative, both in high-resolution imaging (e.g. Cowley & Smith, 1987) and convergent-beam diffraction (e.g. Zuo, Spence & O'Keeffe, 1988;Bird, James & Preston, 1987;Zuo, Spence & H0ier, 1989) it is important to know whether or not it matters to include absorption more rigorously.…”

Section: )Vgmentioning

confidence: 99%

Absorptive form factors for high-energy electron diffraction

Bird¹,

King²

1990

Acta Cryst Sect A

257

102

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The thermal diffuse scattering contribution to the absorptive potential in high-energy electron diffraction is calculated in the form of an absorptive contribution to the atomic form factor. To do this, the Einstein model of lattice vibrations is used, with isotropic Debye-Waller factors. The absorptive form factors are calculated as a function of scattering vector s and temperature factor M on a grid which enables polynomial interpolation of the results to be accurate to better than 2% for much of the ranges 0-< Ms 2<-6 and 0_< M_<2/~2. The computed values, together with an interpolation routine, have been incorporated into a Fortran subroutine which calculates both the real and absorptive form factors for 54 atomic species.

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Section: )Vgmentioning

confidence: 99%

Absorptive form factors for high-energy electron diffraction

Bird¹,

King²

1990

Acta Cryst Sect A

257

102

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“…Improvement in resolution over the years for TEM and STEM, before and after aberration correction. Data for (axial bright field) TEM from: Knoll andRuska (1932), von Ardenne (1940), Menter (1956), Bassett and Menter (1957), Mulvey (1962), Iijima and Allpress (1973), Hirabayashi et al (1982), Smith et al (1982), Matsui et al (1991), Ichinose et al (1999), Phillipp et al (1994), for aberration-corrected (AC) TEM from: Haider et al (1998b), Tanaka et al (2003), Akashi et al (2015), for STEM from: von Ardenne (1938), Crewe et al (1968Crewe et al ( , 1970, Crewe (1974), Cowley and Smith (1987), Nellist andPennycook (1989, 1998), Shin et al (1989), Pennycook et al (1993), for AC-STEM from: Batson et al (2002), Nellist et al (2004), Sawada et al (2007), Erni et al (2009).…”

Section: The Success Of Aberration Correctionmentioning

confidence: 99%

Ultra-high resolution electron microscopy

2016

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The last two decades have seen dramatic advances in the resolution of the electron microscope brought about by the successful correction of lens aberrations that previously limited resolution for most of its history. We briefly review these advances, the achievement of sub-Ångstrom resolution and the ability to identify individual atoms, their bonding configurations and even their dynamics and diffusion pathways. We then present a review of the basic physics of electron scattering, lens aberrations and their correction, and an approximate imaging theory for thin crystals which provides physical insight into the various different imaging modes. Then we proceed to describe a more exact imaging theory starting from Yoshioka's formulation and covering full image simulation methods using Bloch waves, the multislice formulation and the frozen phonon/quantum excitation of phonons models. Delocalization of inelastic scattering has become an important limiting factor at atomic resolution. We therefore discuss this issue extensively, showing how the full-width-half-maximum is the appropriate measure for predicting image contrast, but the diameter containing 50% of the excitation is an important measure of the range of the interaction. These two measures can differ by a factor of 5, are not a simple function of binding energy, and full image simulations are required to match to experiment. The Z-dependence of annular dark field images is also discussed extensively, both for single atoms and for crystals, and we show that temporal incoherence must be included accurately if atomic species are to be identified through matching experimental intensities to simulations. Finally we mention a few promising directions for future investigation.

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“…Modern electron microscopists have the luxury of studying the atomic structure of materials directly through real space imaging. With resolving power that distinguishes atomic columns in a crystal, one can count the atoms across a grain boundary, identify the structure of interfaces, and locate individual defects and dopants (Wall et al, 1974; Cowley & Smith, 1987; Batson et al, 2002; Voyles et al, 2003; Muller, 2009). However, real-space analysis of crystals is not always sufficient and the discrete Fourier transform (DFT) of atomic resolution images is routinely used to mimic a diffraction pattern—with reciprocal lattice spots reflecting the symmetry and spacing of a specimen’s crystal structure (Rust, 1974; Hashimoto et al, 1980).…”

Section: Introductionmentioning

confidence: 99%

Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images

et al. 2015

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The discrete Fourier transform is among the most routine tools used in high-resolution scanning/transmission electron microscopy (S/TEM). However, when calculating a Fourier transform, periodic boundary conditions are imposed and sharp discontinuities between the edges of an image cause a cross patterned artifact along the reciprocal space axes. This artifact can interfere with the analysis of reciprocal lattice peaks of an atomic resolution image. Here we demonstrate that the recently developed Periodic Plus Smooth Decomposition technique provides a simple, efficient method for reliable removal of artifacts caused by edge discontinuities. In this method, edge artifacts are reduced by subtracting a smooth background that solves Poisson's equation with boundary conditions set by the image's edges. Unlike the traditional windowed Fourier transforms, Periodic Plus Smooth Decomposition maintains sharp reciprocal lattice peaks from the image's entire field of view.

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The present and future of high-resolution electron microscopy

Cited by 25 publications

References 43 publications

Absorptive form factors for high-energy electron diffraction

Absorptive form factors for high-energy electron diffraction

Ultra-high resolution electron microscopy

Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images

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