1987
DOI: 10.1107/s010876738709857x
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The present and future of high-resolution electron microscopy

Abstract: High-resolution electron microscopy, with the current resolution limits of better than 2A, has been proven to be a valuable technique for the study of radiation-resistant crystals, allowing the determination of the structures of perfect crystal regions, crystal defects and crystal surfaces with atomic resolution. As the resolution is improved, however, the image contrast is increasingly determined by dynamical diffraction effects and it is increasingly sensitive to the instrumental parameters and to the geomet… Show more

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Cited by 25 publications
(6 citation statements)
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“…With electron microscopy becoming increasingly quantitative, both in high-resolution imaging (e.g. Cowley & Smith, 1987) and convergent-beam diffraction (e.g. Zuo, Spence & O'Keeffe, 1988;Bird, James & Preston, 1987;Zuo, Spence & H0ier, 1989) it is important to know whether or not it matters to include absorption more rigorously.…”
Section: )Vgmentioning
confidence: 99%
“…With electron microscopy becoming increasingly quantitative, both in high-resolution imaging (e.g. Cowley & Smith, 1987) and convergent-beam diffraction (e.g. Zuo, Spence & O'Keeffe, 1988;Bird, James & Preston, 1987;Zuo, Spence & H0ier, 1989) it is important to know whether or not it matters to include absorption more rigorously.…”
Section: )Vgmentioning
confidence: 99%
“…Improvement in resolution over the years for TEM and STEM, before and after aberration correction. Data for (axial bright field) TEM from: Knoll andRuska (1932), von Ardenne (1940), Menter (1956), Bassett and Menter (1957), Mulvey (1962), Iijima and Allpress (1973), Hirabayashi et al (1982), Smith et al (1982), Matsui et al (1991), Ichinose et al (1999), Phillipp et al (1994), for aberration-corrected (AC) TEM from: Haider et al (1998b), Tanaka et al (2003), Akashi et al (2015), for STEM from: von Ardenne (1938), Crewe et al (1968Crewe et al ( , 1970, Crewe (1974), Cowley and Smith (1987), Nellist andPennycook (1989, 1998), Shin et al (1989), Pennycook et al (1993), for AC-STEM from: Batson et al (2002), Nellist et al (2004), Sawada et al (2007), Erni et al (2009).…”
Section: The Success Of Aberration Correctionmentioning
confidence: 99%
“…Modern electron microscopists have the luxury of studying the atomic structure of materials directly through real space imaging. With resolving power that distinguishes atomic columns in a crystal, one can count the atoms across a grain boundary, identify the structure of interfaces, and locate individual defects and dopants (Wall et al, 1974; Cowley & Smith, 1987; Batson et al, 2002; Voyles et al, 2003; Muller, 2009). However, real-space analysis of crystals is not always sufficient and the discrete Fourier transform (DFT) of atomic resolution images is routinely used to mimic a diffraction pattern—with reciprocal lattice spots reflecting the symmetry and spacing of a specimen’s crystal structure (Rust, 1974; Hashimoto et al, 1980).…”
Section: Introductionmentioning
confidence: 99%