The PolLux Microspectroscopy Beam line at the Swiss Light Source

Flechsig, U.; Quitmann, C.; Raabe, Jörg; Böge, M.; Fink, R.; Ade, Harald

doi:10.1063/1.2436109

Cited by 51 publications

(43 citation statements)

References 5 publications

(5 reference statements)

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“…Slits, limiting the size s 0 of the secondary source, were used to control the degree of coherence of the radiation collected by the FZP aperture. Several zone-doubled FZPs with a diameter of 100 mm were mounted and tested as focusing elements of the STXM end-station [20,21]. High resolution STXM images were acquired at 1.2 keV photon energy ðl ¼ 1:03 nmÞ using a step size of 2.5 nm and a dwell time of 50 ms.…”

Section: Resultsmentioning

confidence: 99%

Advanced thin film technology for ultrahigh resolution X-ray microscopy

et al. 2009

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Section: Resultsmentioning

confidence: 99%

Advanced thin film technology for ultrahigh resolution X-ray microscopy

et al. 2009

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“…At present the highest-quality spectra are delivered by scanning (STXM) microscopes. State-of-the-art scanning transmission X-ray microscopes (STXMs) for soft X rays are, for example, found at the National Synchrotron Light Source (NSLS) (Feser et al, 1998), the Advanced Light Source (ALS) (Kilcoyne Q et al, 2003), the Advanced Photon Source (APS) (Bluhm et al, 2006), BESSy (Wiesemann et al, 2003), the Canadian Light Source (CLS) , or the Swiss Light Source (Flechsig et al, 2007) (see Table 17.1 for a list of beam lines often used for NOM research). In soft X-ray STXMs up to 2 keV, wet specimens with a thickness up to a few micrometer can be examined for elements such as carbon, nitrogen, oxygen, iron, calcium, aluminum, silicon, or potassium at a spatial resolution of about 35 nm at present (with advances being currently made), with an energy resolution of about 0.1 eV.…”

Section: Nexafs Techniques and Instrumentationmentioning

confidence: 99%

Synchrotron‐Based Near‐Edge X‐Ray Spectroscopy of Natural Organic Matter in Soils and Sediments

Lehmann

Solomon

Brandes

et al. 2009

Biophysico‐Chemical Processes Involving Natural Nonliving Organic Matter in Environmental Systems

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SyNCHROTRON-BASED NEAR-EDgE X-RAy SPECTROSCOPy discrete radii indexed by a principal quantum number n = 1,2,3 …, and discrete binding energies for single-electron atoms of E n = −E 0 Z 2 /n 2 , where Z is the atomic number and E 0 = 13.6 eV (see Figure 17.1). When the energy of incident photons is increased to match the binding energy of an electron, the photon absorption probability suddenly increases in what is called an X-ray absorption edge (step function in Figure 17.2, which is at about 290 eV for carbon), so that the electron is completely removed from the atom in an ionization event (absorption edges are also labeled figure 17.1. Atom in the Bohr model. The electrons surround the nucleus. An incoming photon can lift an electron to a not fully occupied, higher orbital or remove it entirely from the atom. Energy (eV)280 285 290 295 300 Normalized absorption Measured ModeledStep functionfigure 17.2. Carbon NEXAFS spectrum of NOM from the Suwannee River (IHSS standard humic acid mounted on indium foil; total electron yield using a dwell time of 200 msec and an exit slit of 50 µm, calibrated to CO at 287.38 eV, Canadian Light Source SgM beamline 11-ID.1) to show pre-edge features and the so-called "edge". The spectrum is deconvoluted using a series of gaussian curves (g) at energy positions of known transitions, along with a step function at the edge as described by .

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“…3, the Ir layer uniformly covers the sidewalls of a Si template. Focusing experiments using the fabricated FZPs were performed in the x-ray scanning transmission microscope (STXM) at the PolLux beam line [12] of the Swiss Light Source (Villigen, Switzerland). The measurements were performed at 1 keV x-ray energy.…”

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Zone-Doubling Technique to Produce Ultrahigh-Resolution X-Ray Optics

Vila‐Comamala²,

et al. 2007

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A method for the fabrication of ultrahigh-resolution Fresnel zone plate lenses for x-ray microscopy is demonstrated. It is based on the deposition of a zone plate material (Ir) onto the sidewalls of a prepatterned template structure (Si) using an atomic layer deposition technique. This results in a doubling of the effective zone density, thus improving the achievable resolution of x-ray microscopes. Test structures with lines and spaces down to 15 nm were resolved in a scanning transmission x-ray microscope at 1 keV photon energy.

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The PolLux Microspectroscopy Beam line at the Swiss Light Source

Cited by 51 publications

References 5 publications

Advanced thin film technology for ultrahigh resolution X-ray microscopy

Advanced thin film technology for ultrahigh resolution X-ray microscopy

Synchrotron‐Based Near‐Edge X‐Ray Spectroscopy of Natural Organic Matter in Soils and Sediments

Zone-Doubling Technique to Produce Ultrahigh-Resolution X-Ray Optics

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