The performance of photon counting imaging with a Geiger mode silicon avalanche photodiode

Qu, Hanbing; Zhang, Yifan; Ji, Zhong-Jie; Chen, Qian

doi:10.1088/1612-2011/10/10/105201

Cited by 5 publications

(2 citation statements)

References 10 publications

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“…With the development of the complementary metaloxide-semiconductor (CMOS) technology, [1,2] single-photon avalanche diode (SPAD) detectors based on this technology have been favored by researchers and have been applied to many fields, including laser ranging, [3] fluorescence lifetime imaging, [4] two-dimensional scanning imaging, [5] and other such applications because of their increased sensitivity, high gain coefficients, and increased response speeds.…”

Section: Introductionmentioning

confidence: 99%

Dark count in single-photon avalanche diodes: A novel statistical behavioral model*

Yu¹,

Xu²,

Lu³

2020

Chinese Phys. B

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Dark count is one of the inherent noise types in single-photon diodes, which may restrict the performances of detectors based on these diodes. To formulate better designs for peripheral circuits of such diodes, an accurate statistical behavioral model of dark current must be established. Research has shown that there are four main mechanisms that contribute to the dark count in single-photon avalanche diodes. However, in the existing dark count models only three models have been considered, thus leading to inaccuracies in these models. To resolve these shortcomings, the dark current caused by carrier diffusion in the neutral region is deduced by multiplying the carrier detection probability with the carrier particle current at the boundary of the depletion layer. Thus, a comprehensive dark current model is constructed by adding the dark current caused by carrier diffusion to the dark current caused by the other three mechanisms. To the best of our knowledge, this is the first dark count simulation model into which incorporated simultaneously are the thermal generation, trap-assisted tunneling, band-to-band tunneling mechanisms, and carrier diffusion in neutral regions to evaluate dark count behavior. The comparison between the measured data and the simulation results from the models shows that the proposed model is more accurate than other existing models, and the maximum of accuracy increases up to 31.48% when excess bias voltage equals 3.5 V and temperature is 50 °C.

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Section: Introductionmentioning

confidence: 99%

Dark count in single-photon avalanche diodes: A novel statistical behavioral model*

Yu¹,

Xu²,

Lu³

2020

Chinese Phys. B

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show abstract

“…In this imaging method, a digital micro-mirror device (DMD) is used to modulate the optical image of target and a single photon point detector is used to detect the modulated light. The photon counts output by the detector and the random binary patterns loaded into DMD are used to reconstruct the target image by CS reconstruction algorithm [1]- [7]. Owing to the use of CS theory, single photon compressive imaging can perform compressive sampling of images, which not only shortens the sampling time and saves the storage space, but also improves signal-to-noise ratio (SNR) [8].…”

Section: Introductionmentioning

confidence: 99%

Sampling Time Adaptive Single-Photon Compressive Imaging

Wang

Yan

et al. 2019

IEEE Photonics J.

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We propose a time-adaptive sampling method and demonstrate a samplingtime-adaptive single-photon compressive imaging system. In order to achieve self-adapting adjustment of sampling time, the theory of threshold of light intensity estimation accuracy is deduced. According to this threshold, a sampling control module, based on fieldprogrammable gate array, is developed. Finally, the advantage of the time-adaptive sampling method is proved experimentally. Imaging performance experiments show that the time-adaptive sampling method can automatically adjust the sampling time for the change of light intensity of image object to obtain an image with better quality and avoid speculative selection of sampling time.

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Pile-up correction in characterizing single-photon avalanche diodes of high dark count rate

et al. 2018

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The performance of photon counting imaging with a Geiger mode silicon avalanche photodiode

Cited by 5 publications

References 10 publications

Dark count in single-photon avalanche diodes: A novel statistical behavioral model*

Dark count in single-photon avalanche diodes: A novel statistical behavioral model*

Sampling Time Adaptive Single-Photon Compressive Imaging

Pile-up correction in characterizing single-photon avalanche diodes of high dark count rate

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