2010
DOI: 10.1134/s1063782610090101
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The nature of edge luminescence of CdTe:Mg diffusion layers

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Cited by 4 publications
(4 citation statements)
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“…• C, the annealing time was 1 h. A differential reflection spectrum R ω analysis confirmed a formation of the new semiconducting film on the illuminated substrate's side due to the thermal treatment [3]. A peak in the R ω signal was observed at the photon energy of hν = 3.3 eV, which was well correlated with the zinc oxide band gap energy E g at 300 K [4].…”
Section: Methodsmentioning
confidence: 59%
“…• C, the annealing time was 1 h. A differential reflection spectrum R ω analysis confirmed a formation of the new semiconducting film on the illuminated substrate's side due to the thermal treatment [3]. A peak in the R ω signal was observed at the photon energy of hν = 3.3 eV, which was well correlated with the zinc oxide band gap energy E g at 300 K [4].…”
Section: Methodsmentioning
confidence: 59%
“…The samples were divided into two groups. The first group of samples was processed in a suspension of alkali metals [11] Li-CdTe:Li. The second group of samples was not subjected to treatment and is further designated as CdTe.…”
Section: Manufacturing Technology Of Sbdsmentioning
confidence: 99%
“…Further the formation of a transparent conductive glass based on cadmium or tellurium oxides can be an interesting solution for obtaining heterojunctions [6]. This method has been already developed for polycrystalline CdTe for photovoltaic applications, in order to grow transparent conductive oxides [7,8,9].…”
Section: Introductionmentioning
confidence: 99%