2018
DOI: 10.1109/tcpmt.2017.2768400
|View full text |Cite
|
Sign up to set email alerts
|

The Mathematical Model of Contact Resistance and Injected Current in DRM Tests of SF6 Circuit Breaker

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
7
0

Year Published

2018
2018
2024
2024

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 9 publications
(8 citation statements)
references
References 17 publications
0
7
0
Order By: Relevance
“…The implementation of this technique and its repeatability have been recently focused in many efforts. Reference [38]- [42] indicated that the measured resistance in this test is dependent on the injected DC current and opening velocity. The resistance decreases with an increase in the injectedcurrent and decrease of the velocity.…”
Section: Dynamic Resistance Measurementmentioning
confidence: 93%
“…The implementation of this technique and its repeatability have been recently focused in many efforts. Reference [38]- [42] indicated that the measured resistance in this test is dependent on the injected DC current and opening velocity. The resistance decreases with an increase in the injectedcurrent and decrease of the velocity.…”
Section: Dynamic Resistance Measurementmentioning
confidence: 93%
“…In recent years, several studies have been developed on this theme [4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22]. However, these studies do not present an agreed methodology for measurement and analysis to define reference parameters to correlate the DRM results to the level of contact wear.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, for the complete consolidation of the DRM as contact degradation level technique, additional parameters beyond the area under the DRM curve should be addressed. Additional evaluating parameters were studied over the years, such as: the level of mass transferred by the contacts [15]; acoustic vibration [16]; average arcing and MC resistances (MCRs) [17, 18]; time difference between separation of the main and AC [19] and; maximum resistance over the entire curve [20].…”
Section: Introductionmentioning
confidence: 99%