Throughout its lifetime, high-voltage circuit breaker (HVCB) contacts suffer from inevitable degradation processes, especially during the formation of electric arcs. Highly degraded contacts can reduce the current interruption capacity and increase the chances of operational faults, which might lead to considerable financial losses. Therefore, the use of efficient evaluating techniques is a key factor to achieve systems reliability. The dynamic resistance measurement (DRM) is a technique that can be used to evaluate the degradation level of HVCB' contacts. It stands out from the usual technique, static resistance measurement, by allowing the assessment of both the main contacts and the arcing contacts (ACs). Usually, the mean resistance or the area under the DRM curve is used to estimate the AC degradation. However, DRM is a non-standardised technique and there are no specified parameters to evaluate the real wear conditions. Therefore, an analysis of alternative parameters extractible from the DRM technique is presented in this study, such as amplitude and variance of the DRM curve. The results attest the possible use of more than one parameter for the continuous evaluation of HVCB ACs, characterising the DRM as a more complete and precise diagnosis tool.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.