The magnetic and structural properties of the oblique incident Fe films

Wang, Y.J.; Tang, Qi; Wang, Zh.Q.; Fan, Hong Jin; Fan, Shenghua; Li, F.H.

doi:10.1016/0304-8853(85)90030-7

Cited by 5 publications

(2 citation statements)

References 15 publications

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“…However, it is mostly used for characterization of single crystal epitaxial films. [1][2][3][4] While there are many other thinfilm microstructures of practical interest, such as textured polycrystalline films, [5][6][7] these cases are only recently being addressed. The practical value of RHEED techniques to texture determination in polycrystalline thin film has recently been emphasized by Andrieu et al 8 These authors calculated RHEED patterns corresponding to specific textures and symmetries ͑bcc͒ and showed that it is possible to extract quantitative information on the angular distribution of grains within the film.…”

Section: Introductionmentioning

confidence: 99%

In situ thin-film texture determination

Litvinov

O’Donnell

Clarke

1999

Journal of Applied Physics

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A kinematic theory of reflection high energy electron diffraction ͑RHEED͒ is presented for textured polycrystalline thin films. RHEED patterns are calculated for arbitrary texture situations and for any general crystallographic orientation that may be encountered in thin-film growth. It is shown that the RHEED pattern can be used as a fast and convenient tool for in situ texture characterization. The approach also permits quantitative extraction of angular dispersion parameters which are useful for optimizing thin-film growth conditions.

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Section: Introductionmentioning

confidence: 99%

In situ thin-film texture determination

Litvinov

O’Donnell

Clarke

1999

Journal of Applied Physics

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“…This is a biaxial texture. Arcs in RHEED patterns were also observed from oblique angle incident grown Fe films (Wang et al 1985) and CdS film (Laermans et al 1973). In the CdS case, the inclination angle of the c-axis relative to the substrate normal was measured as a function of film thickness under a fixed incident angle.…”

Section: Rheed Transmission Patterns From Textured Filmsmentioning

confidence: 99%

RHEED Transmission Mode and RHEED Pole Figure

Wang

2013

RHEED Transmission Mode and Pole Figures

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In the last chapter, we presented the principles of x-ray diffraction and the construction of a pole figure, particularly the pole figure constructed from the diffraction patterns obtained by an area detector. In this chapter, we describe the similarities and differences between reflection high-energy electron diffraction (RHEED) transmission mode and x-ray diffraction. Detailed descriptions of the diffraction space characteristics of RHEED transmission for a variety of crystal textures are given. We discuss kinematic simulations of RHEED patterns and the construction of RHEED pole figures from RHEED patterns. The relationship between RHEED pole figures and the orientation distribution function of biaxial texture is presented with examples. X-Ray Diffraction vs RHEEDMost thin films grown by common deposition techniques such as physical vapor deposition or chemical vapor deposition are not single crystals. Single crystals are grown only under specific favorable conditions. A major technique used for texture structure characterization is the x-ray pole figure. The typical photon energy used in x-ray diffraction is 8,048 eV (Cu K α ), while tens of kiloelectron volt electrons are used for reflection high-energy electron diffraction (RHEED). Here we discuss the similarities and differences between x-ray diffraction and the RHEED transmission mode. Strength of scattering cross sectionThe scattering cross section for electrons in solids is orders of magnitude higher than that for x-rays. For example, the total elastic electron scattering from Mo at 10 keV incident electron energy is on the order of 10 −19 m 2 (Browning 1991). In the energy range of 1-100 keV, the cross-section scales as E −0.5 in the low-energy regime and E −1 and Z 1.33 in the high-energy regime, where E is in units of keV and Z is the atomic number of an atom. For 1 keV photon, the total photon cross section from Pb is on the order of 10 −22 m 2 (Hubbell et al. 1975). The stronger scattering cross section of electrons provides a stronger electron diffraction signal from ultrathin films and nanostructures.

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What information can be obtained by RHEED applied on polycrystalline films?

Andrieu

Fréchard

1996

Surface Science

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The magnetic and structural properties of the oblique incident Fe films

Cited by 5 publications

References 15 publications

In situ thin-film texture determination

In situ thin-film texture determination

RHEED Transmission Mode and RHEED Pole Figure

What information can be obtained by RHEED applied on polycrystalline films?

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