2008
DOI: 10.1016/j.jcis.2008.09.033
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The in situ characterization and structuring of electrografted polyphenylene films on silicon surfaces. An AFM and XPS study

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Cited by 16 publications
(22 citation statements)
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References 37 publications
(40 reference statements)
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“…Similarly, the possibility of charge transfer by tunneling through thin dielectrics [187][188][189][190][191][192] could allow the use of electrochemical techniques for derivatizing the surface of the adlayer, 193,194 without direct modification of the TMD material. Representative electrochemical techniques that may be useful include electrogelation, 195,196 electrografting 197 (for example aryl diazonium salts, 198 ), localized click-reactions, 199,200 and electrodeposition.…”
Section: Functional Adlayersmentioning
confidence: 99%
“…Similarly, the possibility of charge transfer by tunneling through thin dielectrics [187][188][189][190][191][192] could allow the use of electrochemical techniques for derivatizing the surface of the adlayer, 193,194 without direct modification of the TMD material. Representative electrochemical techniques that may be useful include electrogelation, 195,196 electrografting 197 (for example aryl diazonium salts, 198 ), localized click-reactions, 199,200 and electrodeposition.…”
Section: Functional Adlayersmentioning
confidence: 99%
“…High concentrations (>1 mM), and long deposition times at excessive negative potentials are favorable conditions for multilayer formation [8- 11]. The limiting film thickness is typically less than 10 nm although thicker films may be obtained with some aryl groups [9,[12][13][14]. Electroless grafting from diazonium salts was also demonstrated, mainly on carbonaceous surfaces [15][16][17].…”
Section: Introductionmentioning
confidence: 99%
“…For monolayers on smooth surfaces i. e. sub nm roughness, atomic force microscopy (AFM) or scanning tunneling microscopy (STM) can identify packing variations and defect sites however, STM in particular is generally considered unsuitable for rough surfaces (nm‐μm roughness) due to scan range limitations. More importantly, to identify whether a surface feature observed in an image is an electroactive pinhole and not simply an undulation (characteristic of rough surfaces), a probe which provides an electrochemical response is necessary …”
Section: Introductionmentioning
confidence: 99%
“…More importantly, to identify whether a surface feature observed in an image is an electroactive pinhole and not simply an undulation (characteristic of rough surfaces), a probe which provides an electrochemical response is necessary. [4][5][6] Scanning electrochemical microscopy (SECM) bridges nm and micron resolution, and can directly probe electrochemical activity. [7,8] In the context of surface modification, SECM has been used to quantify heterogeneous rate constants at surface monolayers, [9,10] diffusion through porous films.…”
Section: Introductionmentioning
confidence: 99%