ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005.
DOI: 10.1109/iccad.2005.1560148
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The impact of the nanoscale on computing systems

Abstract: Abstract-Nanoscale technologies provide both challenges and opportunities. We show that the issues and potential solutions facing designers are technology independent and arise mainly from shrinking device sizes and an increase in the number of devices available. We explore how it is possible to use some of the devices that will be available to help ease design complexity as well as overcome process related challenges such as limited layout freedom, increased defect densities, timing constraints, and power dis… Show more

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Cited by 9 publications
(7 citation statements)
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“…Intrinsic and extrinsic volatility is a problem likely to be encountered by many Unconventional Computing fabrics, especially at the nano/molecular scale [10]. Our results suggest a possible solution to this problem using unsupervised, bidirectional plasticity rules which automatically repair previously established decision boundaries.…”
Section: Discussionmentioning
confidence: 83%
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“…Intrinsic and extrinsic volatility is a problem likely to be encountered by many Unconventional Computing fabrics, especially at the nano/molecular scale [10]. Our results suggest a possible solution to this problem using unsupervised, bidirectional plasticity rules which automatically repair previously established decision boundaries.…”
Section: Discussionmentioning
confidence: 83%
“…the network made no attempt to account for errant synapses) and the degradation in performance persisted throughout the experiment. In the adaptive case, all synaptic weights, including those producing unreliable output, were continuously updated according to the AHAH rule (10). Remarkably, unsupervised bidirectional plasticity was able to restore performance on the XOR classification task until the decision surface roughly recovered its initial configuration.…”
Section: Xor Examplementioning
confidence: 99%
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“…At the circuit level, defect mapping techniques at per chip basis are proposed for post fabrication reconfiguration to identify defective devices and utilize spare defect free devices as functional units. At system level, redundancy based techniques such as N modular redundancy use multiple copies of the same application is executed and then using the majority voting the correct result is determined [4].…”
Section: Introductionmentioning
confidence: 99%