The feasibility of the pixe technique in the analysis of stamps and art objects

Johanson, E.S.; Johanson, Sven A.E.; Malmqvist, Klas; Wiman, Ingela M.B

doi:10.1016/0168-583x(86)90421-0

Cited by 13 publications

(1 citation statement)

References 7 publications

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“…Potentially subtle variations in ink and/or paper of stamps with otherwise identical designs may affect their value and desirability to philatelists and investors or reveal them to be forgeries or reprints. Because of its ability to nondestructively reveal elemental compositions, proton-induced X-ray emission spectrometry (PIXE) has long been an applicable technique for analysis of a variety of historical inks and papers (Cahill et al, 1981;Johanson, 1989;Demortier, 1991;Hassanzadeh et al, 1999) and has been used for analysis of postage stamps from the technique's early days to the present (e.g., Cahill et al, 1981;Malmqvist, 1986;Almquist, 1985Almquist, , 1986Almquist, , 1988Johanson et al, 1986;Hall and Lee, 1990;Johanson, 1992;Cheng et al, 1996Cheng et al, , 1998Pillay, 2000;Oliaiy et al, 2009;Voltr and Nejedly, 2012). …”

Section: Introductionmentioning

confidence: 99%

Proceedings of the First International Symposium on Analytical Methods in Philately

Lera¹,

Barwis²,

Herendeen³

2013

Smithsonian Contributions to History and Technology

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Smithsonian Institution Scholarly Press s m i t h s o n i a n c o n t r i b u t i o n s t o h i s t o r y a n d t e c h n o l o g y • n u m b e r 5 7Proceedings of the First International Symposium on Analytical Methods in Philately In these series, the Institution publishes small papers and full-scale monographs that report on the research and collections of its various museums and bureaus. The Smithsonian Contributions Series are distributed via mailing lists to libraries, universities, and similar institutions throughout the world.Manuscripts submitted for series publication are received by the Smithsonian Institution Scholarly Press from authors with direct affiliation with the various Smithsonian museums or bureaus and are subject to peer review and review for compliance with manuscript preparation guidelines. General requirements for manuscript preparation are on the inside back cover of printed volumes. For detailed submissions requirements and to review the "Manuscript Preparation and Style Guide for Authors," visit the Submissions page at www.scholarlypress.si.edu. s m i t h s o n i a n c o n t r i b u t i o n s to h i s to ry a n d t e c h n o l o g y • n u m b e r 5 7Proceedings Readers will find insights to research methods used across the entire spectrum of philatelic interests, from composition and physical characteristics of paper, to the chemistry and mineralogy of printing ink, to determining the genuineness of stamps, overprints, and the uses of adhesives on cover. Some of these projects were funded in part by the Institute for Analytical Philately and the National Postal Museum. The rights to text and images in this publication, including cover and interior designs, are owned either by the Smithsonian Institution, by contributing authors, or by third parties. Fair use of materials is permitted for personal, educational, or noncommercial purposes. Users must cite author and source of content, must not alter or modify copyrighted content, and must comply with all other terms or restrictions that may be applicable. Users are responsible for securing permission from a rights holder for any other use.

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Section: Introductionmentioning

confidence: 99%

Proceedings of the First International Symposium on Analytical Methods in Philately

Lera¹,

Barwis²,

Herendeen³

2013

Smithsonian Contributions to History and Technology

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Analysis of Iranian postage stamps belonging to the Qajar dynasty (18th–20th century's) by micro‐PIXE

2009

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Eighteen historical Iranian postage stamps belonging to the Qajar dynasty were analyzed by micro‐particle induced X‐ray emission (PIXE) and complementary techniques using Van de Graaff accelerator in the Nuclear Science and Technology Research Institute in Iran. The aim of this study was to determine the elemental composition of different papers and inks of Iranian stamps printed in the Netherlands, Austria, France and Iran. The results obtained in this work show differences between elemental composition of stamps printed in different places and indicate that micro‐PIXE is a suitable technique for this kind of analysis. Copyright © 2009 John Wiley & Sons, Ltd.

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Measurement of proton beam fluence by PIXE analysis of residual gas

Voltr

Nejedlý²

2012

X-Ray Spectrometry

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Knowledge of beam fluence has a crucial role in quantitative particle‐induced X‐ray emission analysis. In some situations, a direct measurement of the beam charge on the target is either impossible or impractical. In such cases, indirect determination of the beam fluence can utilise the characteristic X‐ray of argon or other gases, which was being kept at a stable low partial pressure in the vicinity of the analysed sample. As the X‐ray signal of argon depends on the total charge, it can be used to quantify the charge. This paper describes the experimental design, the hardware and software modules that we created, the validation of the method, the application of the method during elemental analyses of fragile philatelic samples with overprints, and the lessons learned. Copyright © 2012 John Wiley & Sons, Ltd.

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The feasibility of the pixe technique in the analysis of stamps and art objects

Cited by 13 publications

References 7 publications

Proceedings of the First International Symposium on Analytical Methods in Philately

Proceedings of the First International Symposium on Analytical Methods in Philately

Analysis of Iranian postage stamps belonging to the Qajar dynasty (18th–20th century's) by micro‐PIXE

Measurement of proton beam fluence by PIXE analysis of residual gas

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