1999
DOI: 10.1016/s0925-9635(98)00348-3
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The effects of substrate temperature and laser wavelength on the formation of carbon thin films by pulsed laser deposition

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Cited by 22 publications
(7 citation statements)
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“…It has been reported that superior smoothness can be achieved independent of thickness such that AFM of 0.9 nm thick films remain 0.13 nm in roughness [28]. The dependence of DLC on deposition wavelength is consistent with the reports by others [29,30]. At higher photon energy, lower penetration depth of shorter wavelength laser in the ablation of graphite results in higher ionized energetic species for subplantation growth of high sp 3 content DLC films [31].…”
Section: Dlc Propertiessupporting
confidence: 86%
“…It has been reported that superior smoothness can be achieved independent of thickness such that AFM of 0.9 nm thick films remain 0.13 nm in roughness [28]. The dependence of DLC on deposition wavelength is consistent with the reports by others [29,30]. At higher photon energy, lower penetration depth of shorter wavelength laser in the ablation of graphite results in higher ionized energetic species for subplantation growth of high sp 3 content DLC films [31].…”
Section: Dlc Propertiessupporting
confidence: 86%
“…Systematic study has shown that superior and almost constant roughness of~0.12 nm were achieved in tetrahedral amorphous carbon films with thicknesses from 0.9 nm to 60 nm [9]. The dependence of DLC on deposition wavelength is consistent to the reports by others [10,11]. At higher photon energy, lower penetration depth of shorter wavelength laser in the ablation of graphite results in higher ionized energetic species for subplantation growth of high sp 3 content DLC films [12].…”
Section: Dlc Propertiessupporting
confidence: 84%
“…approximately 1.1 eV, which is close to and higher than that obtained by a pulsed laser deposition technique at room temperature. 13,14)…”
Section: Armentioning
confidence: 99%