2018
DOI: 10.1007/s10854-018-9521-2
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The effects of solvent treated PEDOT:PSS buffer layer in organic solar cells

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Cited by 3 publications
(1 citation statement)
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“…The surface of the pristine PEDOT:PSS film shows the lowest value of roughness R q = 1.57 nm, and an increase with IPA post-treatment is observed to a maximum of R q = 1.93 nm using the dip technique. The increase of surface roughness in treated PEDOT:PSS films is well reported and may occur due to redistribution of PSS and PEDOT chains [32,33,34]. To confirm this, Figure 7e–h shows the AFM phase images and their high-contrast version for the different PEDOT:PSS films.…”
Section: Resultssupporting
confidence: 63%
“…The surface of the pristine PEDOT:PSS film shows the lowest value of roughness R q = 1.57 nm, and an increase with IPA post-treatment is observed to a maximum of R q = 1.93 nm using the dip technique. The increase of surface roughness in treated PEDOT:PSS films is well reported and may occur due to redistribution of PSS and PEDOT chains [32,33,34]. To confirm this, Figure 7e–h shows the AFM phase images and their high-contrast version for the different PEDOT:PSS films.…”
Section: Resultssupporting
confidence: 63%