1994
DOI: 10.1109/20.333931
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The effect of rise time and field gradient on nonlinear bit shift in thin film heads

Abstract: We present a discussion of nonlinear bit shift in thin film inductive heads. A three dimensional finite element model and two dimensional dynamic and self consistent model were used to calculate the nonlinear bit shift as a function of rise time, write current waveform and pole tip saturation. The analysis shows a strong dependency of nonlinear bit shift on rise time and write pole magnetic image. A comparison of experimental data with the theoretical model is presented.

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Cited by 15 publications
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