Anisotropic etching of Si (100) and (110) planes in alkaline solutions containing the nonionic surfactant is studied in this paper. Triton X-100 surfactant, normally used for the modification of TMAH (tetramethylammonium hydroxide) etchant, is added to KOH (potassium hydroxide) solution. As a result, the (100) and (110) etch rates are significantly reduced and the etch rate ratio R(100)/R(110) >1 is obtained. The influence of KOH concentration (at 10 and 100 ppm (v/v) of the surfactant) on the etching process is also investigated. Low roughness of (110) surface is achieved in the 2 M KOH solution containing Triton. The smooth {110} sidewall planes inclined at 45°toward the (100) substrate are fabricated by etching in the KOH + Triton solution. The 45°{110} sidewalls are potentially attractive as MEMS micromirrors for optical beam reflection at an angle of 90°. The low etch rate of (100) plane is kind of a disadvantage of the fabrication method, but it can be fairly overcome by elevating the process temperature and stirring the etching solution.[
2012-0371]Index Terms-Anisotropic etching, potassium hydroxide (KOH), silicon, surfactant, Triton X-100.