The effect of film thickness on the magnetic and magneto-transport properties of Sr₂FeMoO₆thin films

Abstract

Abstract.Magnetoresistive Sr 2 FeMoO 6 thin films were grown by pulsed laser deposition with three different thicknesses 150 nm, 270 nm and 500 nm. Structural, magnetic and magneto-transport properties of the films were measured. Structural properties showed that impurity phases are formed when the film thickness exceed limiting thickness over 300 nm. Otherwise no major differences were observed in structural and magnetic properties between the films. The semiconductive upturn was observed in all ρ(T ) curves, but it was notably smaller for the two thickest films. At 350 K the magnetoresistive (MR) behaviour was very similar for all the films, but at 10 K the negative MR was clearly largest for the thickest film and also the shape of the curve in low fields deviated from others.

The predominance of substrate induced defects in magnetic properties of Sr2FeMoO6thin films

“…It seems that the growth rate of SFMO is similar on all the other substrates excluding the LSAT. The used 2000 pulses lead to a film thickness of 160-170 nm, which is very close to the earlier observed value of 150 nm [42]. However, the growth rate of SFMO on LSAT is lower and the film thickness of 135-145 nm is achieved with 2000 pulses.…”