Abstract:The effect of a nonconductive adhesive (NCA) on the reliability of chip-on-glass (COG) bonding was studied. Double layer bumps consisting of dome-shaped Sn on Cu columns were formed by electroplating and a reflow process, and were used for this study. COG bonding was performed between the reflowed Sn/Cu bumps on the oxidized Si wafer and an indium tin oxide/Au/Cu/Ti/glass substrate using a thermocompression bonder. Three types of NCAs were applied during COG bonding: NCA-A with no fillers, NCA-B with fluoropol… Show more
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