2008
DOI: 10.1016/j.microrel.2008.03.026
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The effect of downscaling the dimensions of solder interconnects on their creep properties

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Cited by 45 publications
(16 citation statements)
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“…In previous related studies, characterization of constitutive alloy behavior is usually done through tensile tests using standard specimens. To obtain a relevant constitutive data for real interconnections, the specimens had to be scaled down to a typical solder joint size if one considers the extremely small solder volumes in modern microelectronic industry [11,12]. Therefore, the design optimization of solder joints could be conducted with different geometries to investigate the tensile behavior.…”
Section: Methodsmentioning
confidence: 99%
“…In previous related studies, characterization of constitutive alloy behavior is usually done through tensile tests using standard specimens. To obtain a relevant constitutive data for real interconnections, the specimens had to be scaled down to a typical solder joint size if one considers the extremely small solder volumes in modern microelectronic industry [11,12]. Therefore, the design optimization of solder joints could be conducted with different geometries to investigate the tensile behavior.…”
Section: Methodsmentioning
confidence: 99%
“…34 Scale effects of deformation of solder alloys have been discussed, because solder joint sizes have recently become small, e.g., on the micron scale. 13,35 However, study of bulk solder remains important to understand details of the ratchetting deformation of Pb-free and Pb-containing solder alloys, as it is difficult to obtain accurate test results using micron-scale specimens of actual solder joints. For example, deformation of micron-scale specimens is affected by crystal orientations in the specimens because they contain small numbers of crystals.…”
Section: Methodsmentioning
confidence: 99%
“…[5][6][7][8][9][10][11][12][13][14][15][16] The authors have conducted creep tests using Pb-free and Pb-containing solder alloys and conducted structural analyses of electronic packaging. 5 It was concluded that the creep deformation of Pb-free solder alloys is smaller than that of Pb-containing solder alloys and that time-dependent deformation plays an important role in the reliability of solder joints of electronic packaging.…”
Section: Introductionmentioning
confidence: 99%
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“…For thin films and thin layers the deformation or damage mechanism "feel" the presence of the surface or an interface (Arzt 1998;Kraft et al 2010). As a result, the inelastic response of microcomponents and solder joints depends essentially on their dimensions (Wiese et al 2008;Wiese 2010). Experimental results on inelastic behavior of thin films and micropillars are reviewed in (Kraft et al 2010).…”
Section: Microstructural Features and Length Scale Effectsmentioning
confidence: 99%