The Effect of Change in Refractive Index on Wave Propagation Through (FeS2) Thin Film

Ugwu, E. I.; ., P.C. Uduh; Agbo, G. A.

doi:10.3923/jas.2007.570.574

Cited by 11 publications

(2 citation statements)

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“…The first of its type was the use of beam propagation technique whereby the dielectric properties were employed in studying and computing beam or field propagation through a medium with variation in small refractive index [2,3]. The beam propagation method based on diagonalization of the Hermetician operator that generates the solution of the Helmholtz equation in media with real refractive indices [4], has been utilized in this study by some researchers while others had somehow used 2x2 propagation matrix formalism for finding the obliquely propagated electromagnetic fields in layered inhomogeneous un-axial structure which also involved bean propagation [5]. Structures such as optical fibers and optical wave guides in the presence of electro-optical perturbation have been well understood by the application of this method [6][7][8].…”

Section: Introductionmentioning

confidence: 99%

“…Scientists have also looked at the propagation of electromagnetic field through a conducting surface [3] where the behavior of wave propagated through such material coupled with the influence of the dielectric function of the medium on such material coupled with the effect of variation of the refractive index on some species of the thin film had been analyzed as well using the same approach [11]. And a close look at the concept made it clear that recognition of the importance of the effect of the refractive index of the medium and dielectric function culminated in the reality of the creation of two velocity components that normally give rise to phase and group refractive indices as considered in the study of wave propagation [12][13][14][15].…”

Section: Introductionmentioning

confidence: 99%

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Theoretical Analysis of the Solid State and Optical Characteristics of Calcium Sulphide [CaS] Thin Film

Ifeanyi Ugwu

2024

Thin Films - Growth, Characterization and Electrochemical Applications

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The analysis of the calcium sulphide thin film material which is one of the families of chalcogenide groups of thin film materials was carried out in this work using a theoretical approach for which the propagated wave through the medium of the thin film that is deposited on a glass substrate is considered to be a scalar wave in nature. The thin film material is sectioned into twos, first section is termed homogeneous reference dielectric constant, εref where no thin film is deposited on the substrate and the second part is termed perturbed dielectric function, Δεpz containing the deposited thin film on the glass substrate. These two terms were substituted on the defined scalar wave equation that was subsequently solved using the method of separation of variable which invariably utilized in the transformation of the equation into the second type of Volterra equation. On the other hand, Green’s function approach was also introduced in order to arrive at the model equation that culminates in an expression showcasing the wave propagated through the thin film material medium. This was subsequently applied in the computation of waves, ψz that is propagating through the material medium for various wavelengths within the ultraviolet, visible, and near-infrared region of the electromagnetic wave spectrum for which the influence of the aforementioned dielectric constant and function were invoked. The computed values from this mechanism were in turn utilized in the analysis of the band gap, optical, and solid-state properties of the calcium sulphide (CaS) thin film materials.

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