2010
DOI: 10.1260/1750-9548.4.4.305
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Theoretical Study of Field Propagation Through a Nonhomogeneous Thin Film Medium Using Lippmann-Schwinger Equation

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Cited by 2 publications
(2 citation statements)
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“…Scientists have also looked at the propagation of electromagnetic field through a conducting surface [3] where the behavior of wave propagated through such material coupled with the influence of the dielectric function of the medium on such material coupled with the effect of variation of the refractive index on some species of the thin film had been analyzed as well using the same approach [11]. And a close look at the concept made it clear that recognition of the importance of the effect of the refractive index of the medium and dielectric function culminated in the reality of the creation of two velocity components that normally give rise to phase and group refractive indices as considered in the study of wave propagation [12][13][14][15]. Recently more complicated work had been embarked upon on the study of wave propagation through a modeled thin with dielectric perturbation in which WKB approximation in conjunction with numerical approach were used [16][17][18] along with beam propagation technique to unravel the mechanism of theoretical analysis of wave propagation through materials and based on that, lots of work had been veraciously carried out in term of the influence of dielectric constants and refractive index on beam propagating through materials [3,5,12,17,19] in other to ascertain their roles and efficacy on the use of beam propagation method and again the effect of the refractive index of the medium in the reality of the two velocity components that normally give rise to phase and group refractive indices as generally considered when it comes to the study of wave propagation because their influence on the propagated beam [13].…”
Section: Introductionmentioning
confidence: 99%
“…Scientists have also looked at the propagation of electromagnetic field through a conducting surface [3] where the behavior of wave propagated through such material coupled with the influence of the dielectric function of the medium on such material coupled with the effect of variation of the refractive index on some species of the thin film had been analyzed as well using the same approach [11]. And a close look at the concept made it clear that recognition of the importance of the effect of the refractive index of the medium and dielectric function culminated in the reality of the creation of two velocity components that normally give rise to phase and group refractive indices as considered in the study of wave propagation [12][13][14][15]. Recently more complicated work had been embarked upon on the study of wave propagation through a modeled thin with dielectric perturbation in which WKB approximation in conjunction with numerical approach were used [16][17][18] along with beam propagation technique to unravel the mechanism of theoretical analysis of wave propagation through materials and based on that, lots of work had been veraciously carried out in term of the influence of dielectric constants and refractive index on beam propagating through materials [3,5,12,17,19] in other to ascertain their roles and efficacy on the use of beam propagation method and again the effect of the refractive index of the medium in the reality of the two velocity components that normally give rise to phase and group refractive indices as generally considered when it comes to the study of wave propagation because their influence on the propagated beam [13].…”
Section: Introductionmentioning
confidence: 99%
“…The effect of variation of refractive index of FeS2 had also been carried out theoretically for the purpose of getting a clear understanding of the how variation of refractive index of the tin film effects its application in optoelectronic and solar cell [9] From the study, a close look on the concept made it clear to recognize the importance of the effect of the refractive index of the medium in the reality of the two velocity components that normally give rise to phase and group refractive indices as considered study of wave propagation [10,11,12] More complicated work had been embarked upon on the study of wave propagation through a modeled thin with dielectric perturbation in which W.K.B approximation in conjunction with with the application of numerical technique [ This had gone a long way to reveal the efficacy of theoretical approach in understanding the mechanism on of wave propagating through thin film material due to the flexibility of green's function that facilitates the iterative process involved in the computation technique. [13,14,15] Based on high cost of experimental analysis involved in the characterization of the grown thin films and sometimes non-availability of the machine especially in some parts of our third world countries because of their cost, we based this work on the use of theoretical concept to study the optical properties of manganese sulfide thin film in order to circumvents the use of experimental analysis and characterization. Our method here involves propagating an input field over a small distant representing the thin film thickness through the thin film medium using scalar wave equation with Born approximation method with which iteration technique is applied during the solution.…”
Section: Introductionmentioning
confidence: 99%