A new instrumental concept, distance-of-flight mass spectrometry (DOFMS), is demonstrated experimentally. In DOFMS the mass-to-charge ratio of ions is determined by the distance each ion travels during a fixed time period; the mass spectrum is then recorded with a positionsensitive detector. The DOF approach provides a new way to separate and quantify components of complex samples. Initial results are demonstrated with a glow discharge ion source and a microchannel plate-phosphor screen detector assembly for atomic ion determination. This detection system demonstrated mass spectral peak widths of approximately 0.65 mm, corresponding to resolving powers of approximately 400-600 for a number of elemental samples.Key words: Mass spectrometry, Instrumentation, Glow discharge S ince the development of the first mass spectrograph over 90 years ago [1], numerous methods and instruments have been developed to separate and determine ions of varying mass-to-charge ratio (m/z). Currently, mass spectrometry (MS) can be accomplished by electrostatic and magnetic dispersion (sector-field MS), radio-frequency stability and filtering (quadrupoles and ion traps), resonance frequency determination (Fourier-transform ion cyclotron resonance and Orbitrap® MS), or velocity-based separation (time-of-flight MS). These mature MS technologies are routinely employed in a range of applications from biomolecule analysis to elemental isotope determination, and are often coupled with each other to achieve tandem MS analysis [2,3]. In the present paper, we describe the first implementation of a new form of MS, termed distance-offlight mass spectrometry (DOFMS), and suggest potential benefits of this new mass separation technique.Distance-of-flight mass spectrometry is akin to time-offlight mass spectrometry (TOFMS) in that both techniques separate ions of different m/z based upon an imparted m/zdependent velocity. In TOFMS, each ion is given the same energy (thus achieving a m/z-dependent velocity), and the m/z of each ion is calculated from the time required for it to traverse a known distance to a single detector. Conversely, in DOFMS the m/z of an ion is measured based on the spatial location of each ion at a specific time after the initial acceleration. As a useful analogy, DOFMS is to TOFMS as thin-layer chromatography is to elution chromatography (e.g., LC). TOFMS measures ions as they come off the "column", whereas DOFMS measures how far the ions travel after a specific separation time. Whereas TOFMS disperses ions in time, DOFMS disperses ions in space.The principle behind DOFMS is illustrated in Figure 1. To implement DOFMS, the primary ion beam is introduced into an orthogonal extraction region where ions are subjected to a brief electrostatic field, imparting identical momentum to each ion. This constant-momentum acceleration (CMA) is accomplished by limiting the temporal width and electrostatic field