2014
DOI: 10.1016/j.ultramic.2014.02.004
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The development of a 200kV monochromated field emission electron source

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Cited by 44 publications
(24 citation statements)
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“…To perform heating experiments, mono-layer graphene was transferred to commercially available chips (DENS-C-SH30), incorporating a platinum heating coil 18 in which slits of 0.2 Â 1 lm had been drilled using a focused ion beam. Selected area diffraction patterns were recorded using a monochromated dual aberration corrected JEOL-2200 MCO TEM, 19 operating at 80 kV with an electron beam energy spread of $380 meV. To perform in-situ heating experiments, a SH30-4M-FS (DENS solutions) TEM sample holder was used.…”
Section: Methodsmentioning
confidence: 99%
“…To perform heating experiments, mono-layer graphene was transferred to commercially available chips (DENS-C-SH30), incorporating a platinum heating coil 18 in which slits of 0.2 Â 1 lm had been drilled using a focused ion beam. Selected area diffraction patterns were recorded using a monochromated dual aberration corrected JEOL-2200 MCO TEM, 19 operating at 80 kV with an electron beam energy spread of $380 meV. To perform in-situ heating experiments, a SH30-4M-FS (DENS solutions) TEM sample holder was used.…”
Section: Methodsmentioning
confidence: 99%
“…However, recent progress in a chromatic aberration correctors (C c o 10 μm) [30,32] and electron source monochromators (ΔEo30 meV) [33,34] means that the focus spread along the depth can be sufficiently reduced that d c should approach the Ångstrom level. Therefore, in the following, we assume a perfectly monochromated and geometric-aberration-free electron source and study the impact of just the illumination angle α on the depth of field.…”
Section: Chromatic Aberration and The Depth Of Fieldmentioning
confidence: 99%
“…Due to recent advancements in transmission electron microscope (TEM) electron source monochromation [15][16][17], an EEL spectrometer coupled to a TEM column now allows for detailed investigations of π → π * transitions between the SWCNT conduction and valence VHSs [18,19]. Moreover, TEM and scanning (S) TEM allow for the determination of the chiral indices of each investigated tube using either a Fourier transform (FFT) of a high-resolution image [19,20] or an electron diffraction pattern [18,21,22].…”
Section: Introductionmentioning
confidence: 99%