The Determination of the Electronic Parameters of Thin Amorphous Organic Films by Ellipsometric and Spectrophotometric Study

Nosidlak, Natalia; Dulian, Piotr; Mierzwiński, Dariusz; Jaglarz, Janusz

doi:10.3390/coatings10100980

Cited by 4 publications

(2 citation statements)

References 31 publications

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“…Spectroscopic ellipsometry is a widely used technique to characterize the optical properties of organic thin films [29]. Here we investigate the optical properties of samples using a V-VASE ellipsometer (J.A.…”

Section: Characterizationmentioning

confidence: 99%

Fabrication by Spin-Coating and Optical Characterization of Poly(styrene-co-acrylonitrile) Thin Films

et al. 2021

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The optical characteristics of poly(styrene-co-acrylonitrile) thin films obtained by spin-coating of polymer blend in tetrahydrofuran were investigated by spectroscopic ellipsometry, spectrophotometry, and atomic force microscopy. Film thickness can be broadly varied by changing the polymer concentration.The film thickness dependence on PSAN concentration shows a non-linear behavior that can be explained by a concentration-dependent viscosity. According to previously proposed models, prepared solutions are close to the concentrated solution regime. Films show a broad transparency range and refractive index independent of film thickness. The refractive index values range from 1.55 to 1.6 in the visible range. Thermal treatment revealed good stability of the films up to 220 °C and a progressive deterioration for larger temperatures, with evident damage at 300 °C. UV-induced photodegradation was observed and results showed a progressive decrease of transmittance in the range between 200 and 300 nm but PSAN thin films show no changes when exposed to light from a solar illuminator. These investigations indicate that PSAN is an excellent candidate for thin film polymer-based optical uses like interference coatings or encapsulation of solar cells.

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Section: Characterizationmentioning

confidence: 99%

Fabrication by Spin-Coating and Optical Characterization of Poly(styrene-co-acrylonitrile) Thin Films

et al. 2021

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“…Spectroscopic ellipsometry (SE) is one of the research methods that can be used to determine all these crucial issues as it is an especially useful, fast, non-destructive measurement technique for studying the optical properties and thickness of samples and enabling the evaluation of the morphology of the samples [6][7][8]. By applying the proper modelling and fitting analysis recipes, we can achieve a comprehensive characterization of interfacial layers [9].…”

Section: Introductionmentioning

confidence: 99%

Spectroscopic Ellipsometry Studies on Solution-Processed OLED Devices: Optical Properties and Interfacial Layers

Gioti

2022

Materials

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Τhe fabrication of organic light-emitting diodes (OLEDs) from solution involves the major problem of stack integrity, setting the determination of the composition and the characteristics of the resulting interfaces prerequisite for the optimization of the growth processes and the achievement of high devices’ performance. In this work, a poly(9,9-dioctylfluorene) (F8) and poly(9,9-dioctylfluorene-alt-benzothiadiazole) (F8BT) blend is used for the emissive layer (EML), poly-3,4-ethylene dioxythiophene; poly-styrene sulfonate (PEDOT:PSS) is used for a hole transport layer (HTL), and Poly(9,9-bis(3′-(N,N-dimethyl)-N-ethylammoinium-propyl-2,7-fluorene)-alt-2,7-(9,9-dioctylfluore-ne))dibromide (PFN-Br) for an electron transport layer (ETL) to produce the OLED device. All the layers are developed using the slot-die process, onto indium tin oxide (ITO)-coated polyethylene terephthalate (PET) flexible substrates, whereas Ag cathode was formed by ink-jet printing under ambient conditions. Spectroscopic ellipsometry measurements were performed upon completion of the successive films’ growth, in sequential steps, for the multilayer OLED development. Ellipsometry analysis using different models demonstrate the degree of intermixing within the layers and provide information about the interfaces. These interfacial properties are correlated with the emission characteristics as well as the final performance of the OLED devices.

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Effects of carbazolyl and diphenylamino substituents bearing methoxy groups on the performance of hole-transporting materials in OLEDs

Bezvikonnyi,

Durgaryan,

Tamulevicius

et al. 2024

Spectrochimica Acta Part A: Molecular and Biomolecular Spectros

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The Determination of the Electronic Parameters of Thin Amorphous Organic Films by Ellipsometric and Spectrophotometric Study

Cited by 4 publications

References 31 publications

Fabrication by Spin-Coating and Optical Characterization of Poly(styrene-co-acrylonitrile) Thin Films

Fabrication by Spin-Coating and Optical Characterization of Poly(styrene-co-acrylonitrile) Thin Films

Spectroscopic Ellipsometry Studies on Solution-Processed OLED Devices: Optical Properties and Interfacial Layers

Effects of carbazolyl and diphenylamino substituents bearing methoxy groups on the performance of hole-transporting materials in OLEDs

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