2022
DOI: 10.1007/s10971-021-05683-y
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The deep investigation of structural and opto-electrical properties of Yb2O3 thin films and fabrication of Al/Yb2O3/p-Si (MIS) Schottky barrier diode

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Cited by 13 publications
(2 citation statements)
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“…The high n value results from the N ss , inhomogeneities of BH and R s . [18][19][20][21][22] The rectifying-ratio (RR) of a diode is defined as I F /I R . Figure 3 shows the RR vs T plot of the diode at ±3 V. The RR value decreases with increase in the temperature.…”
Section: Resultsmentioning
confidence: 99%
“…The high n value results from the N ss , inhomogeneities of BH and R s . [18][19][20][21][22] The rectifying-ratio (RR) of a diode is defined as I F /I R . Figure 3 shows the RR vs T plot of the diode at ±3 V. The RR value decreases with increase in the temperature.…”
Section: Resultsmentioning
confidence: 99%
“…In addition, there is no shift observed in the diffraction angles of the peaks and the relative intensities of the obtained peaks also remains constant. This might be a consequence of the calcination process which is effective in producing high phase purity in the samples with desired composition [14]. Furthermore, the size of the crystallites (D) in the synthesized NiO nano particles was calculated by using Debye-Scherrer's formula mentioned in the following Eq.…”
Section: Xray Diffraction Analysismentioning
confidence: 99%