Lower percentiles of product lifetime are useful for engineers to understand product failure, and avoiding costly product failure claims. This paper proposes a percentile re-parameterization model to help reliability engineers obtain a better lower percentile estimation of accelerated life tests under Weibull distribution. A log transformation is made with the Weibull distribution to a smallest extreme value distribution. The location parameter of the smallest extreme value distribution is re-parameterized by a particular 100pth percentile, and the scale parameter is assumed to be nonconstant. Maximum likelihood estimates of the model parameters are derived. The confidence intervals of the percentiles are constructed based on the parametric and nonparametric bootstrap method. An illustrative example and a simulation study are presented to show the appropriateness of the method. The simulation results show that the re-parameterization model performs better compared with the traditional model in the estimation of lower percentiles, in terms of Relative Bias and Relative Root Mean Squared Error.