The Coherence Description of the Dynamical X‐Ray Diffraction from Randomly Disordered Crystals I. General Formalism

Holý, V.

doi:10.1002/pssb.2221110139

Cited by 50 publications

(6 citation statements)

References 13 publications

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“…These features will influence the scattering pattern and will be considered in this section. The scattering is generally very weak and can be treated kinematically, although some authors have extended this to dynamical theory, (Kato, 1980;Olekhnovich and Olekhnovich, 1981;Holý, 1982;Khrupa, 1992;Pavlov and Punegov, 1998), but since we wish to give a general understanding we will concentrate on the kinematical approximation. The differences in the two theories are in the very fine detail that is usually obscured by the Bragg scattering, although of course it is very important to establish the validity of the kinematical theory approach and these articles largely confirm this.…”

Section: Scattering By Small Defectsmentioning

confidence: 99%

The Theory of X-Ray Scattering

Fewster¹

2015

X-Ray Scattering From Semiconductors and Other Materials

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This chapter presents the scattering theories applicable to analyzing thin film and polycrystalline materials. The 2-beam dynamical theory is derived, because of its usefulness in simulating scattering from epitaxial semiconductors. The limitations of this model are discussed along with extensions and alternatives that are more exact, including an approach that generates all the appropriate reflections making it a truly multiplebeam dynamical theory. The kinematic model is discussed and its applicability to thin films and imperfect materials, and how the optical theory is adequate for specular reflectivity. An alternative theory for Xray diffraction is also presented that considers the scattering throughout space, which is particularly relevant for studying polycrystalline materials. It will also become obvious how the whole process is intricately linked to the instrument. The distorted-wave Born Approximation is discussed along with applications in modeling diffuse scattering.

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Section: Scattering By Small Defectsmentioning

confidence: 99%

The Theory of X-Ray Scattering

Fewster¹

2015

X-Ray Scattering From Semiconductors and Other Materials

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“…is readily calculated from (9), This model is capable of predicting the experimentally observed deviations of volume and lattice parameter from the respective Vegard's law.…”

Section: (5)mentioning

confidence: 99%

Lattice Dilatation in High‐Concentration Binary Solid Solutions

Maiti

Roy

1984

Physica Status Solidi (b)

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A simple extension of Huang's theory of lattice dilatation for low concentration is found to reproduce Retger's law of additivity of molar volume. Deviation from the law is accounted for by considering the elastic strength of the defect to be concentration dependent and an attempt is made to calculate the elastic strength of the defect from the parameters of the perfect crystal. The method is then used to predict the concentration dependence of volume over the entire concentration range of eight alkali halide solid solutions and two metallic alloys and fairly good agreement is obtained.Es wird gefunden, da13 eine einfache Erweiterung der Huangschen Theorie der Gitterdilatation fur niedrige Konzentration das Retgersche Gesetz der Additivitiit der Molarvolumen reproduziert. Abweichungen vom Gesetz werden dadurch erkliirt, daB die elastische Stlrke des Defekts als konzentrationsabhangig beriicksichtigt wird, und es wird versucht, die elastische Stiirke des Defekts aus den Parametern des perfekten Kristalls zu berechnen. Die Methode wird dann benutzt, um die Konzentrationsabhiingigkeit des Volumens iiber den gesamten Konzentrationsbereich fur acht Alkalihalogenidmischkristalle und zwei metallische Legierungen vorauszusagen, und es wird ziemlich gute ubereinstimmung erhalten.

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“…At the same time, Holý proposed another variant of dynamical theory based on the optical coherence formalism 25 – 28 and applied this approach for determining the parameters of the single crystals’ microdefects 29 – 31 . In addition, the distorted wave Born approximation was used for calculation of scattering patterns for the case when the microdefects are contained in the thin crystalline layers 32 .…”

Section: Introductionmentioning

confidence: 99%

X-ray dynamical diffraction by quasi-monolayer graphene

Skakunova,

Olikhovskii,

Radchenko

et al. 2023

Sci Rep

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We study the processes of dynamical diffraction of the plane X-ray waves on the graphene film/SiC substrate system in the case of the Bragg diffraction geometry. The statistical dynamical theory of X-ray diffraction in imperfect crystals is applied to the case of real quasi-two-dimensional systems. The necessity of the taking into account of the variability of the lattice parameter of multilayer graphene, as well as the influence of thickness on the thermal Debye–Waller factor at the calculation of the complex structural factors and Fourier components of polarizability, is demonstrated. It is shown that the change of the structural characteristics of the 3-layer graphene/substrate system, as well as its strained state, leads to a significant change in the diffraction profiles, which makes it possible to determine the characteristics by the X-ray diffraction method.

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The Coherence Description of the Dynamical X‐Ray Diffraction from Randomly Disordered Crystals I. General Formalism

Cited by 50 publications

References 13 publications

The Theory of X-Ray Scattering

The Theory of X-Ray Scattering

Lattice Dilatation in High‐Concentration Binary Solid Solutions

X-ray dynamical diffraction by quasi-monolayer graphene

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