The capacitance loss mechanism of metallized film capacitor under pulsed discharge condition

Li, Hua; Chen, Yaohong; Lin, Fuchang; Peng, Bo; Lv, Fei; Zhang, Miao; Li, Zhiwei

doi:10.1109/tdei.2011.6118648

Cited by 34 publications

(10 citation statements)

References 5 publications

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“…It has been reported that the capacitance of an aluminum metalized self-healing (SH) film capacitor, which is widely used in large-current applications, is gradually lost through corona discharge due to voltage fluctuations. [10][11][12][13] This phenomenon is commonly observed around the edge of the electrode. Conventionally, AC capacitors are used with an applied voltage lower than that of DC capacitors to avoid the effect of corona discharge.…”

Section: Introductionmentioning

confidence: 93%

Capacitive energy storage and recovery for synchrotron magnets

Koseki

2014

Review of Scientific Instruments

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Feasibility studies on capacitive energy storage and recovery in the main-ring synchrotron of the Japan Proton Accelerator Research Complex were conducted by circuit simulation. The estimated load fluctuation was 96 MVA in total for dipole magnets, which is likely to induce a serious disturbance in the main grid. It was found that the energy stored in the magnets after the excitation period can be recovered to the storage capacitor by controlling the voltage across the energy-storage capacitor using a pulse-width-modulation converter and reused in the next operational cycle. It was also found that the power fluctuation in the main grid can be reduced to 12 MVA. An experimental evaluation of an aluminum metalized film capacitor revealed that capacitance loss was induced by a fluctuating voltage applied to the storage capacitor when applying the proposed method. The capacitance loss was induced by corona discharge around the edges of segmented electrodes of a self-healing capacitor. The use of aluminum-zinc alloy was evaluated as a countermeasure to mitigate the effect induced by the corona discharge. For a zinc content of 8%, which was optimized experimentally, a capacitor with a sufficient life time expectancy of 20 years and a working potential gradient of 250 V/μm was developed.

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Section: Introductionmentioning

confidence: 93%

Capacitive energy storage and recovery for synchrotron magnets

Koseki

2014

Review of Scientific Instruments

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Section: Film Microstructure and Mechanical Properties A Structumentioning

confidence: 99%

“…The results of the Wide Angle X-ray Diffraction (WAXD) of three films with thicknesses 3.8, 7.8, and 11.8 µm revealed that the 11.8 µm film has the lamellar size (17.1, 15.2, 15.6, 14 and 24.2 nm) with reflection peaks (110), (301), (040), (130), and (400), respectively. While the orientation peaks of (400) and (130) for the 7.8 and 3.8 µm films were absent. Calculations of diffraction peak (040) confirmed that the increase in the lamellae size ; 11.9, 12.9, and 15.2nm corresponded with the increase in film thicknesses 3.8, 7.8, and 11.8 µm, respectively.It should be noted that the crystallinity ratio and the lamellas size increase with the film thickness, consequently, the rigid amorphous phase increases as compared to the mobile amorphous phase associated with α-relaxation [21].…”

Section: Film Microstructure and Mechanical Properties A Structumentioning

confidence: 99%

“…Therefore, the biggest void in which an ionization product can reach a sufficient amount of kinetic energy is most likely occurs in the thick film [129]. Anyway, the dielectric films are subjected to high stress under the influence of the superimposed voltage via exposure to voltage ripples and abrupt wave changes that increase the repetition rates of PD with increments in ripple frequency; self-healing is consequently enhanced [130], [131]. The increment in self-healing repetition with the continuous weakening of the metal layer results in electrode deterioration via electrochemical corrosion, and the amount of leakage current within the dielectric is increased [123], [130].…”

Section: ) Under Ac Voltagementioning

confidence: 99%

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Ageing: Causes and Effects on the Reliability of Polypropylene Film Used for HVDC Capacitor

Umran

Wang

2020

IEEE Access

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It is well-known that the high-performance polymeric dielectric films used for high-voltage DC capacitors should have outstanding capabilities in terms of electrical and mechanical properties in order to face harsh operating conditions. Many factors limit the ability of these thin films to face different and growing stresses according to modern electrical requirements. Microstructure properties, additives, impurities, defects formed during manufacturing as well as applied stress types significantly affect the performance of dielectric films and their operational lifetime. This paper presents a comprehensive review of the factors which affect the ageing, degradation and breakdown of metallised polypropylene (PP) capacitors films. The effects of microstructure, surface morphological properties, mechanical properties and defects on the reliability of biaxially oriented polypropylene films (BOPP) are studied. In addition, the phenomena affecting dielectric performance and ageing mechanisms which are induced by electrical, thermal and electrothermal stresses are discussed.

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“…As the breakdown occurs, current in the metallized electrode around the breakdown site will immediately vaporize the metallization layer. Once the fault has been cleared, MFC would resume functioning successfully and can undergo a large number of breakdowns with the only impact being a slight decline of capacitance [1][2][3][4][5]. Biaxially oriented polypropylene (BOPP) is the present state-of-the-art capacitor dielectric in most pulsed power applications, and this kind of MFC possesses characteristics of high reliability, long lifetime and high energy density [1][2][3][4][5][6].…”

Section: Introductionmentioning

confidence: 99%

The capacitance loss mechanism of metallized film capacitor under pulsed discharge condition

Cited by 34 publications

References 5 publications

Capacitive energy storage and recovery for synchrotron magnets

Capacitive energy storage and recovery for synchrotron magnets

Ageing: Causes and Effects on the Reliability of Polypropylene Film Used for HVDC Capacitor

Modeling of ESR in metallized film capacitors and its implication on pulse handling capability

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