Modeling of ESR in metallized film capacitors and its implication on pulse handling capability

Li, Hua; Huang, Xiang; Li, Zhiwei; Li, Haoyuan; Wang, Wenjuan; Wang, Bowen; Zhang, Qin; Lin, Fuchang

doi:10.1016/j.microrel.2015.04.007

Cited by 14 publications

(5 citation statements)

References 22 publications

(41 reference statements)

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“…In Table 5, all the R-Squared values of the coefficients in the model are at a good level. The proposed ageing model represents the ageing characteristics of the parameters of the capacitors with reasonable accuracy and can be seen as a powerful assistant in the prediction of the 12) and substituting in Equation (11). In this way the natural ageing of capacitors can be obtained.…”

Section: Full-parameter Ageing Modelmentioning

confidence: 97%

“…This phenomenon can lead to a power consumption issue in micro-power applications, it can be an error source in precision analog applications, or it can result in a reliability/thermal management issue in power applications [14]. The parasitic inductance and resistance of the capacitor lead and terminal are represented by [11,14]. They model the phenomenon that after a long-time charging, when the applied voltage is removed the capacitor discharging is incomplete.…”

Section: Complex Impedance Modelmentioning

confidence: 99%

“…In fact, the electrical behavior of non-ideal capacitors is usually described by the lumped element model [11][12][13][14][15][16][17] which consists of a capacitance in combination with parasitic inductances and resistances. The impedance characteristics of the capacitor are closely related to all these parameters in the lumped element model.…”

Section: Introductionmentioning

confidence: 99%

“…The impedance characteristics of the capacitor are closely related to all these parameters in the lumped element model. A non-ideal distributed capacitor model was proposed in [11]. The spray ends, contacts and electrodes as well as the parasitic capacitance were taken into account to precisely show the distributions of the equivalent elements.…”

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

A novel full-parameter ageing modelling approach for capacitors based on complex impedance analysis

Líu

Vandenbosch

Claeys

et al. 2020

IEEE Trans. Dielect. Electr. Insul.

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Capacitors are ubiquitous in electronic devices and play a critical role in the devices' electromagnetic compatibility performance. The ageing of capacitors, due to intrinsic degradation mechanisms and external thermal and electrical stresses, has drawn a wide attention in the reliability field. The variations of the capacitance and equivalent series resistance are typically seen as representative for the ageing of capacitors, while the other parasitic parameters are usually neglected. In this study, a new full-parameter ageing modelling approach of capacitors is proposed based on complex impedance analysis. The ageing characteristics of all the proposed 7 parameters, including all parasitic parameters, are identified by carrying out an electrical overstress accelerated ageing test.

show abstract

Section: Full-parameter Ageing Modelmentioning

confidence: 97%

Section: Complex Impedance Modelmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

A novel full-parameter ageing modelling approach for capacitors based on complex impedance analysis

Líu

Vandenbosch

Claeys

et al. 2020

IEEE Trans. Dielect. Electr. Insul.

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show abstract

“…To fulfill the insulation protection requirements, a certain blank is left at one end of the metallized film, and the metallized film at the other Alternating Humid and Thermal Environment end is thickened. This is known as the heavy edge (HE) process [26][27] . The implementation of the HE process enhances the contact between metal particles sprayed onto the metallized electrode using "Schoopage" technology.…”

Section: Metallized Film Capacitorsmentioning

confidence: 99%

Aging Mechanism and Life Estimation of Photovoltaic Inverter DC-link Capacitors in Alternating Humid and Thermal Environment

Gao,

Li,

Cui

et al. 2024

Chin. J. Electr. Eng.

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DC-link capacitors play a vital role in managing ripple voltage and current in converters and various devices. This study focuses on exploring the aging characteristics of DC-link capacitors in alternating humid and thermal environments aligned with the operational conditions in photovoltaic and wind power applications. Adhering to relevant power equipment standards, we designed a 24-h alternating humid and thermal aging environment tailored to the requirements of DC-link capacitors. An aging test platform is established, and 20 widely used metallized polypropylene film capacitors are selected for evaluation. Parameters such as the capacitance, equivalent series resistance (ESR), and phase angle are assessed during aging, as well as the onset time and extent of aging at various intervals. This study focuses on the aging mechanisms, analyzing electrode corrosion, the self-healing process, and dielectric aging. Fitting the aging characteristics enabled us to calculate the lifespan of the capacitor and predict it under different degrees of capacitance decay. The results show that under alternating humid and thermal conditions, capacitance attenuation and ESR increase exhibit exponential nonlinearity, influenced by factors such as the oxidation and self-healing of capacitive metal electrodes, dielectric main-chain fracture, and crystal transformation. This study underscores the pivotal role of encapsulation in determining the aging decay time.

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Failure mechanism and life estimate of metallized film capacitor under high temperature and humidity

Tai¹,

Chen²,

Yang³

et al. 2022

Microelectronics Reliability

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Modeling of ESR in metallized film capacitors and its implication on pulse handling capability

Cited by 14 publications

References 22 publications

A novel full-parameter ageing modelling approach for capacitors based on complex impedance analysis

A novel full-parameter ageing modelling approach for capacitors based on complex impedance analysis

Aging Mechanism and Life Estimation of Photovoltaic Inverter DC-link Capacitors in Alternating Humid and Thermal Environment

Failure mechanism and life estimate of metallized film capacitor under high temperature and humidity

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