The behavior of pinned layers using a high-field transfer curve

Oh, Sang-Mun; Nishioka, K.; Umezaki, H.; Tanaka, Hideaki; Seki, T.; Sasaki, Shinobu; Ohtsu, T.; Kataoka, K.; Furusawa, K.

doi:10.1109/tmag.2005.855323

Cited by 11 publications

(4 citation statements)

References 3 publications

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“…The signal and noise associated with a TMR head depend on the magnetic field of the disk, making the performance of the free and pinned layers critically important. This also makes it important to clarify the magnetic durability of TMR heads against different types of stress [4,5].…”

Section: Introductionmentioning

confidence: 99%

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Characterization of TMR Head Durability against Lapping Based on Magnetic Performance

Tanaka

Maeda

2012

KEM

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Magnetic recording technologies are continuing to advance toward higher areal densities, driven by the availability of tunneling magnetoresistive (TMR) heads. However, high areal density heads require smaller physical dimensions, and this can render TMR heads more vulnerable to mechanical stresses generated during the lapping process. Although is important to verify the durability of TMR heads against lapping, it is very difficult to perform a crystallographic analysis of the affected layer because of the small dimensions involved. In this study, we attempted to establish an advanced TMR head verification method based on a magnetic performance analysis involving micro-Kerr hysteresis loops and the magnetic noise spectrum. We found that the magnetic performance changed when nanoscale scratches were removed from the lapped surface using ion beam etching. This indicates that the lapping process produces an affected layer which deteriorates the magnetic characteristics of the TMR head. A correlation was also found between the change in magnetic performance and the morphology of lapped surface.

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Section: Introductionmentioning

confidence: 99%

“…Previous studies have identified various instabilities based on the magnetic states of the pinned and free layers [4,5]. However, no detailed study has investigated the effects of mechanical stress on the magnetic performance of TMR heads, particularly with regard to nanoscratching.…”

Section: Introductionmentioning

confidence: 99%

Characterization of TMR Head Durability against Lapping Based on Magnetic Performance

Tanaka

Maeda

2012

KEM

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“…Previous research identified various transfer curves based on the magnetic state of the pinned layer [4,5]. However, no detailed study has been performed of the effects of mechanical stress on the magnetic performance of GMR heads, particularly in regard to nanoscale scratching.…”

Section: Introductionmentioning

confidence: 99%

Evaluation of GMR Head Durability against Nanoscale Scratches Using High-Field Transfer Curves

Tanaka

Chiba

Maeda

2009

AMR

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We investigated the durability of giant magnetoresistive (GMR) heads to nanoscale scratches created during the lapping process. Analysis using high-field transfer curves after deliberate scratching with an atomic force microscope (AFM) identified changes in the magnetization of the head and a reduction in pinning strength, which is a magnetic performance indicator. Additionally, finite element method (FEM) analysis suggested that the overall effects on the GMR head following nanoscale scratching increased with scratch depth.

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“…It was reported ESD damage and EOS damage cause the instability phenomenon that GMR heads amplitude flipping and changing and effect of ESD and EOS to magnetic state of pinned layer [1][2][3][4][5][6]. Recently, it found that the various transfer curves based on the magnetic state of pinned layer [7,8]. In this paper, we show that ESD damages cause the GMR heads to change the magnetic state and explain the mechanism of that phenomenon based on the results of the study of high-field transfer curves.…”

Section: Introductionmentioning

confidence: 99%

Study on high field transfer curves of GMR heads with damaged pinned layer by ESD

Kataoka

Ohtsu

Nishioka

et al. 2007

2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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In order to study the effect of ESD on Anti-Ferro magnetic layer of GMR heads, transfer curves of GMR heads using high-field QST(Quasi Static Tester) were investigated. Transfer curves of GMR heads vary in waveform by applying of ESD damage, but there are many kinds of waveforms of transfer curves of after ESD damaged heads. Analysis of these damaged heads in magnetic state using high-field QST suggested that ESD damage would degrade the interlayer exchange coupling between Pinned layer and Anti-Ferro magnetic layer.

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The behavior of pinned layers using a high-field transfer curve

Cited by 11 publications

References 3 publications

Characterization of TMR Head Durability against Lapping Based on Magnetic Performance

Characterization of TMR Head Durability against Lapping Based on Magnetic Performance

Evaluation of GMR Head Durability against Nanoscale Scratches Using High-Field Transfer Curves

Study on high field transfer curves of GMR heads with damaged pinned layer by ESD

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