Study on high field transfer curves of GMR heads with damaged pinned layer by ESD

Kataoka, K.; Ohtsu, T.; Nishioka, K.; Koyama, N.; Tanaka, Hideaki; Luo, Sam

doi:10.1109/eosesd.2007.4401739

Cited by 4 publications

(2 citation statements)

References 3 publications

(2 reference statements)

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“…The signal and noise associated with a TMR head depend on the magnetic field of the disk, making the performance of the free and pinned layers critically important. This also makes it important to clarify the magnetic durability of TMR heads against different types of stress [4,5].…”

Section: Introductionmentioning

confidence: 99%

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Characterization of TMR Head Durability against Lapping Based on Magnetic Performance

Tanaka

Maeda

2012

KEM

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Magnetic recording technologies are continuing to advance toward higher areal densities, driven by the availability of tunneling magnetoresistive (TMR) heads. However, high areal density heads require smaller physical dimensions, and this can render TMR heads more vulnerable to mechanical stresses generated during the lapping process. Although is important to verify the durability of TMR heads against lapping, it is very difficult to perform a crystallographic analysis of the affected layer because of the small dimensions involved. In this study, we attempted to establish an advanced TMR head verification method based on a magnetic performance analysis involving micro-Kerr hysteresis loops and the magnetic noise spectrum. We found that the magnetic performance changed when nanoscale scratches were removed from the lapped surface using ion beam etching. This indicates that the lapping process produces an affected layer which deteriorates the magnetic characteristics of the TMR head. A correlation was also found between the change in magnetic performance and the morphology of lapped surface.

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Section: Introductionmentioning

confidence: 99%

“…Previous studies have identified various instabilities based on the magnetic states of the pinned and free layers [4,5]. However, no detailed study has investigated the effects of mechanical stress on the magnetic performance of TMR heads, particularly with regard to nanoscratching.…”

Section: Introductionmentioning

confidence: 99%

Characterization of TMR Head Durability against Lapping Based on Magnetic Performance

Tanaka

Maeda

2012

KEM

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Study on head instability using Flying-QST tester for HDDs

Furukawa¹,

Xu²,

Kato³

et al. 2013

Microsyst Technol

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Effects of ESD and EMI on TMR heads during bonding process of gold ball bonding machines

Puapairoj

Sa-ngiamsak

2011

2011 IEEE/SICE International Symposium on System Integration (SII)

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ESD and EMI are important issue in HDD. Ball bond machine makes a micro electrical connection; and this involves high voltage and high frequency current. Other works had only investigated ESD effect. This work newly presents the investigation of the severity of both ESD and EMI on MR heads. Discharge current was captured by a current transducer. EMI effect was monitored using finite integral. The experiments show discharge current was as high as few A. EMI simulations illustrate interference on a current transducer. The benefit of this work leads to higher accuracy in measurement at high frequency range.

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Study on high field transfer curves of GMR heads with damaged pinned layer by ESD

Cited by 4 publications

References 3 publications

Characterization of TMR Head Durability against Lapping Based on Magnetic Performance

Characterization of TMR Head Durability against Lapping Based on Magnetic Performance

Study on head instability using Flying-QST tester for HDDs

Effects of ESD and EMI on TMR heads during bonding process of gold ball bonding machines

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