2013
DOI: 10.1016/j.nima.2013.04.028
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The application of confocal technology based on polycapillary X-ray optics in surface topography

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Cited by 7 publications
(3 citation statements)
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References 13 publications
(11 reference statements)
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“…An interesting application of a confocal EDXRF system was described 25 for the in situ measurement of ion distribution close to the electrode surface during electrolysis of a CuCl 2 solution, opening up the possibility for spatially-resolved analysis of mass transfer in electrolytic tanks, perhaps even with some degree of temporal resolution. A polycapillary optic EDXRF confocal system was also used by Zhao et al 26 who employed a surface adaptive algorithm to establish surface topography and elemental distribution of a ceramic sample. While the claim of obtaining surface topography was made, there were limitations that would readily be overcome using the widely available techniques of SPM and AFM.…”
Section: Laboratory Instruments and Excitation Sourcesmentioning
confidence: 99%
“…An interesting application of a confocal EDXRF system was described 25 for the in situ measurement of ion distribution close to the electrode surface during electrolysis of a CuCl 2 solution, opening up the possibility for spatially-resolved analysis of mass transfer in electrolytic tanks, perhaps even with some degree of temporal resolution. A polycapillary optic EDXRF confocal system was also used by Zhao et al 26 who employed a surface adaptive algorithm to establish surface topography and elemental distribution of a ceramic sample. While the claim of obtaining surface topography was made, there were limitations that would readily be overcome using the widely available techniques of SPM and AFM.…”
Section: Laboratory Instruments and Excitation Sourcesmentioning
confidence: 99%
“…The total time for the measurement was 784 min and the average measurement time of each point is 31 s. The above results show that it is possible to obtain the surface topography using the confocal 3D MXRF setup. The average measurement times for both samples were b31 s, only one-sixth of the time required in our previous work [13]. In the previous work, the surface topography of a cambered surface area and crack on a ceramic chip was obtained.…”
Section: Resultsmentioning
confidence: 95%
“…Although there many other technologies can be applied to characterizing the surface topography of a sample, such as electron microscopy, scanning tunnelling microscopy, optical microscopy, and others, the above technology requires certain conditions and cannot be applied to in situ XRF analysis. In our previous studies [13,14], surface morphology analysis methods based on confocal 3D MXRF was established that could analyse the sample surface morphology without any preprocessing. However, the scanning efficiency was not ideal.…”
Section: Introductionmentioning
confidence: 99%