Testing complex couplings in multiport memories

Nicolaidis, M.; Alves, V. Castro; Bederr, H.

doi:10.1109/92.365454

Cited by 34 publications

(17 citation statements)

References 12 publications

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“…For the same fault models, modified march tests and BIST circuits were reported in [4], [5], [6]. In [7], [8], [9], [10], it has been shown theoretically that the conventional tests for SP memories are insufficient for MP memories. Moreover, theoretical fault models, together with their tests were developed.…”

Section: Introductionmentioning

confidence: 99%

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Efficient tests for realistic faults in dual-port SRAMs

Hamdioui

Goor

2002

IEEE Trans. Comput.

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AbstractÐThis paper begins with an overview of realistic fault models for dual-port memories, divided into single-port faults and faults unique for dual-port memories. The latter faults cannot be detected with the conventional single-port memory tests; they require special tests. A precise notation for all faults, such that ambiguities and misunderstandings will be prevented, has been emphasized. Next, the paper presents a methodology to design tests for realistic unique dual-port memory faults, resulting in a set of three linear singleaddressing tests which are merged into a single march test (March s2PF), and one linear double-addressing test (March d2PF). March s2PF and March d2PF have been implemented at Intel. The results show that they detect unique faults, i.e., faults that cannot be detected with conventional single-port memory tests. This make them very attractive industrially.

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Section: Introductionmentioning

confidence: 99%

“…In the representation of the 2PFs, the following terminology will be reintroduced [7], [8], [9], [10]:…”

Section: Two-port Ffmsmentioning

confidence: 99%

Efficient tests for realistic faults in dual-port SRAMs

Hamdioui

Goor

2002

IEEE Trans. Comput.

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“…One reasonable restriction of intraword CFs (similar to the restriction used in [10]) is that an a-cell can only influence its left or its right physical neighbor. These restricted CFs, denoted as rCFs, apply to the following fault types: rCFsts, rCFids, and rCFdsts.…”

Section: Restricted Cfs (Rcfs)mentioning

confidence: 99%

“…Interleaved (also called: folded): A q-bit row in a subarray contains w Ã B bits. The B bits of a word are spread across B groups [9], [10] in such a way that the bits of a B-bit word are interleaved with (i.e., separated by) w À 1 bits of the other B-bit words in that row. Therefore, only the test for uCFsts has to be applied to one word of each fold in order to verify the I/O data path of each fold.…”

Section: Relationships Of Wom March Tests and The Impact Of The Memormentioning

confidence: 99%

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A systematic method for modifying march tests for bit-oriented memories into tests for word-oriented memories

Goor

Tlili

2003

IEEE Trans. Comput.

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Abstract-Most memory test algorithms are optimized for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented, i.e., read and write operations affect only a single bit in the memory. Traditionally, word-oriented memories have been tested by repeated application of a test for bit-oriented memories, whereby a different data background is used during each application. This results in time inefficiencies and limited fault coverage. A systematic way of converting tests for bit-oriented memories into tests for word-oriented memories is presented, distinguishing between interword and intraword faults. The conversion consists of concatenating to the test for interword faults, a test for intraword faults. This approach results in more efficient tests with complete coverage of the targeted faults. Word-oriented memory tests are very important, because most memories have an external data path which is wider than one bit.

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