1995
DOI: 10.1109/92.365454
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Testing complex couplings in multiport memories

Abstract: In this paper, the effects of simultaneous write access on the fault modeling of multiport RAMs are investigated. New fault models representing more accurately the actual faults in such memories are then defined. Subsequently, a general algorithm that ensures the detection of all faults belonging to the new fault model is proposed. Unfortunately, the obtained algorithms are of O(n/sup 2/) complexity which is not practical for real purposes. In order to reduce the complexity of the former test algorithm a topol… Show more

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Cited by 34 publications
(17 citation statements)
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“…For the same fault models, modified march tests and BIST circuits were reported in [4], [5], [6]. In [7], [8], [9], [10], it has been shown theoretically that the conventional tests for SP memories are insufficient for MP memories. Moreover, theoretical fault models, together with their tests were developed.…”
Section: Introductionmentioning
confidence: 99%
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“…For the same fault models, modified march tests and BIST circuits were reported in [4], [5], [6]. In [7], [8], [9], [10], it has been shown theoretically that the conventional tests for SP memories are insufficient for MP memories. Moreover, theoretical fault models, together with their tests were developed.…”
Section: Introductionmentioning
confidence: 99%
“…In the representation of the 2PFs, the following terminology will be reintroduced [7], [8], [9], [10]:…”
Section: Two-port Ffmsmentioning
confidence: 99%
“…One reasonable restriction of intraword CFs (similar to the restriction used in [10]) is that an a-cell can only influence its left or its right physical neighbor. These restricted CFs, denoted as rCFs, apply to the following fault types: rCFsts, rCFids, and rCFdsts.…”
Section: Restricted Cfs (Rcfs)mentioning
confidence: 99%
“…Interleaved (also called: folded): A q-bit row in a subarray contains w à B bits. The B bits of a word are spread across B groups [9], [10] in such a way that the bits of a B-bit word are interleaved with (i.e., separated by) w À 1 bits of the other B-bit words in that row. Therefore, only the test for uCFsts has to be applied to one word of each fold in order to verify the I/O data path of each fold.…”
Section: Relationships Of Wom March Tests and The Impact Of The Memormentioning
confidence: 99%
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