“…Smaller size and higher frequency applications introduce new and more complicated SRAM faults, such as transition fault, data retention fault, coupling fault, pattern sensitive fault and so on. To detect these faults, we need not only consider new arithmetics like March Cþ, March LR, March S2PF, March D2PF (van de Goor, Gaydadjiev, Yarmolik, and Mikitjuk 1996;Hamdioui and van de Goor 2002), but also at speed test (Hirabayashi et al 2002;Iyengar et al 2006). And furthermore, we need new method that allows SRAM to be tested at full speed for these faults (Cheng, John Hill and Kebichi 2010).…”