Testing an Ortec Lifetime System

Abstract

We report preliminary performance tests of an ORTEC PLS lifetime system based on plastic scintillators and analog electronic system. A variety of samples was measured, from metals (Cu, stainless steel), across semiconductors (Cz-grown silicon, ZnSe) to nanostructured ceramics (ZrO2). All results obtained are compatible with literature reports and indicate the lifetime resolution of the whole system as 180 ps.

Positronium Formation in Molecular Gases --- from Experiment to Modeling

“…The positron annihilation lifetime spectra (PALS) were measured using the fast-fast coincidence ORTEC PLS system equipped with plastic scintillators (St. Gobain BC418) and RCA 8850 photomultipliers [16]. The prompt time resolution of the system was 180 ps in full width at half maximum.…”

Excitation mechanism and thermal emission quenching of Tb ions in silicon rich silicon oxide thin films grown by plasma-enhanced chemical vapour deposition—Do we need silicon nanoclusters?

“…Further details of the deposition system, film growth conditions, and films structure have been discussed previously. 24,25 …”

Positronium Formation in Organic Liquids

“…The positron annihilation lifetime spectra (PALS) were measured using the fast-fast coincidence ORTEC PLS system equipped with plastic scintillators (St. Gobain BC418) and RCA 8850 photomultipliers [17]. The prompt time resolution of the system was 210 ps in full width at half maximum (FWHM).…”