Test vector decomposition-based static compaction algorithms for combinational circuits

Abstract

Testing system-on-chips involves applying huge amounts of test data, which is stored in the tester memory and then transferred to the chip under test during test application. Therefore, practical techniques, such as test compression and compaction, are required to reduce the amount of test data in order to reduce both the total testing time and memory requirements for the tester. In this paper, a new approach to static compaction for combinational circuits, referred to as test vector decomposition (TVD), is proposed. In addition, two new TVD based static compaction algorithms are presented. Experimental results for benchmark circuits demonstrate the effectiveness of the two new static compaction algorithms.

Efficient test compaction for combinational circuits based on Fault detection count-directed clustering

“…In Independent Fault Clustering (IFC) [1,2], Independent Fault Sets (IFSs) with respect to a given test set are first derived. Two faults are independent if they are not detected by the same test vector.…”

“…In static test compaction, the number of test vectors is reduced after they are generated, whereas in dynamic test compaction, the number of test vectors is minimized during the automatic test pattern generation (ATPG) process. Static test compaction algorithms for combinational circuits can be divided into three broad categories [1]: (1) Redundant vector elimination, (2) Test vector modification, and (3) Test vector addition and removal. In the first category, compaction is performed by dropping redundant test vectors.…”

“…In the second category, compaction is performed by modifying test vectors. This is achieved by merging of compatible test vectors based on test relaxation or raising [12,[13][14][15], essential fault pruning [9,[15][16][17], or test vector decomposition and clustering [1][2][3]. Finally, the third category of static compaction algorithms consists of compaction algorithms that add new test vectors to a given test set in order to remove some of the already existing test vectors [10,18].…”

“…Recently, two static compaction techniques based on test vector decomposition and clustering have been proposed in [1][2][3]. The first technique, called Independent Fault Clustering (IFC) [1,2], is based on clustering test vectors according to independent fault sets.…”

“…The first technique, called Independent Fault Clustering (IFC) [1,2], is based on clustering test vectors according to independent fault sets. The second technique, called Class-based Clustering (CBC) [1,3], is based on classifying test vectors into classes and then eliminating test vectors by moving their components to other test vectors.…”