Test-point selection algorithm using small signal model for scan-based BIST

Abstract

A test point selection algorithm TEPSAUS (TEst-Point Selection Algorithm Using Small signal model) for scan based build-in self-test (BIST) is proposed in this paper. In order to reduce the computational complexity, the algorithm uses Small Signal Model (SSM) to build recursion formulas for cost reduction functions. With the recursion functions, the cost reduction functions can be calculated efficiently.