“…In this article we will consider single damages of the stuck-at-fault (0/1) type, that mainly occur in digital combinational devices . To detect such faults, various methods and algorithms [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16] are known, for example: Truth Table and Fault Vatrix method based on the Boolean derivatives (Boolean difference), the Path Sensitization method and the Searching D-Algorithm based on the test patterns (PODEM), Brach-and-Bount method, etc . However, the vast majority of them are based on an analytical approach and are characterized by their complexity and cumbersomeness of practical implementation, that grows with the increase with amount of variables .…”