2012 IEEE 30th VLSI Test Symposium (VTS) 2012
DOI: 10.1109/vts.2012.6231063
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Test generation for subtractive specification errors

Patricia S. Lee
1
,
Ian G. Harris
2

Abstract: Abstract-Scenario-Based Modeling (SBM) exposes Specification Translation Errors (STE), which are not captured using traditional coverage-based test generation techniques that look at the code, not the specification. We improve test generation by specifically exposing subtractive STE.

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