A method for obtaining the average refractive indexes of a birefringent material in the terahertz region in a single measurement with a standard terahertz time-domain spectrometer is presented. The method is based on processing the frequency-domain interference between terahertz pulses and echoes through the Fourier transform of the terahertz spectrum. The technique also allows the determination of the optical axis orientation of the material by making two measurements with different angles of the sample optical axis. Birefringence measurements can be used to derive a wide range of parameters, such as mechanical stress in plastic components, molecular chain alignment in liquid crystals, and orientation of fibers in paper, composites, wood, and other materials [1][2][3]. Different techniques have been applied to characterize birefringent materials, such as visible and near-infrared (NIR) light, x-ray diffraction (XRD), and terahertz radiation. Terahertz spectroscopy allows the characterization of many materials of industrial interest, such as plastics, wood, textiles, and paper that are opaque to visible and NIR light, providing large penetration depth. Besides, terahertz technology offers a safer approach than XRD since it is nonionizing [1]. The birefringence of a material and the orientation of the optical axis in the terahertz band have been obtained by different techniques. The conventional procedure is based on a standard terahertz time-domain spectroscopy (TDS) setup performing at least a reference measure plus three others with three different angles of the sample for achieving both refractive indices and optical axis orientation [4,5]. However, it requires at least four measurements, which can be both slow and cumbersome. A faster way to obtain average refractive indices is by measuring the delay between the peaks of the main pulses and their respective echoes in the temporal domain [6]. This method can only be applied when the delays between pulses and echoes are long enough to distinguish them. When the delay is in the order of the time pulse width, which is generally around 1 ps, a direct time analysis is not possible. Additionally, the determination of the orientation of the optical axis as a relation of the temporal pulse amplitudes [1] is not possible when diattenuation occurs. Another proposal to determine both refractive indices and optical axis in a single measure is developed in [7], where the terahertz spectrometer employs circularly polarized terahertz waves and a polarization-sensitive detector that measures both components of the electric field simultaneously. However, this method is not applicable with a standard terahertz spectrometer.In this Letter, we propose a technique for measuring the average refractive indices of birefringent materials in a single measurement and a method for obtaining the optical axis orientation in materials with constant refractive index in the terahertz range, such as various plastics, paper, or wood [3,6]. The method relies on the information obtained from the...